Suppr超能文献

外延稳定的SrRuFeO薄膜中磁电阻与氧缺陷的关系

Magnetoresistance Versus Oxygen Deficiency in Epi-stabilized SrRu Fe O Thin Films.

作者信息

Dash Umasankar, Acharya Susant Kumar, Lee Bo Wha, Jung Chang Uk

机构信息

Department of Physics and Oxide Research Centre, Hankuk University of Foreign Studies, Yongin, 17035, South Korea.

出版信息

Nanoscale Res Lett. 2017 Dec;12(1):168. doi: 10.1186/s11671-017-1950-y. Epub 2017 Mar 6.

Abstract

Oxygen vacancies have a profound effect on the magnetic, electronic, and transport properties of transition metal oxide materials. Here, we studied the influence of oxygen vacancies on the magnetoresistance (MR) properties of SrRu Fe O epitaxial thin films (x = 0.10, 0.20, and 0.30). For this purpose, we synthesized highly strained epitaxial SrRu Fe O thin films with atomically flat surfaces containing different amounts of oxygen vacancies using pulsed laser deposition. Without an applied magnetic field, the films with x = 0.10 and 0.20 showed a metal-insulator transition, while the x = 0.30 thin film showed insulating behavior over the entire temperature range of 2-300 K. Both Fe doping and the concentration of oxygen vacancies had large effects on the negative MR contributions. For the low Fe doping case of x = 0.10, in which both films exhibited metallic behavior, MR was more prominent in the film with fewer oxygen vacancies or equivalently a more metallic film. For semiconducting films, higher MR was observed for more semiconducting films having more oxygen vacancies. A relatively large negative MR (~36.4%) was observed for the x = 0.30 thin film with a high concentration of oxygen vacancies (δ = 0.12). The obtained results were compared with MR studies for a polycrystal of (Sr La )(Ru Fe )O. These results highlight the crucial role of oxygen stoichiometry in determining the magneto-transport properties in SrRu Fe O thin films.

摘要

氧空位对过渡金属氧化物材料的磁性、电学和输运性质有着深远影响。在此,我们研究了氧空位对SrRuₓFe₁₋ₓO外延薄膜(x = 0.10、0.20和0.30)磁电阻(MR)性质的影响。为此,我们使用脉冲激光沉积法合成了具有原子级平整表面、含有不同数量氧空位的高应变外延SrRuₓFe₁₋ₓO薄膜。在没有施加磁场的情况下,x = 0.10和0.20的薄膜表现出金属 - 绝缘体转变,而x = 0.30的薄膜在2 - 300 K的整个温度范围内都表现出绝缘行为。铁掺杂和氧空位浓度对负MR贡献都有很大影响。对于x = 0.10的低铁掺杂情况,其中两种薄膜都表现出金属行为,氧空位较少或等效地更具金属性的薄膜中MR更显著。对于半导体薄膜,氧空位更多的更具半导体性的薄膜观察到更高的MR。对于具有高浓度氧空位(δ = 0.12)的x = 0.30薄膜,观察到相对较大的负MR(约36.4%)。将所得结果与(Sr₁₋ₓLaₓ)(Ru₀.₅Fe₀.₅)O多晶的MR研究进行了比较。这些结果突出了氧化学计量在确定SrRuₓFe₁₋ₓO薄膜磁输运性质中的关键作用。

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验