Department of Chemical Engineering, Indian Institute of Technology, Kharagpur 721302, India.
Sci Rep. 2017 Mar 17;7:44738. doi: 10.1038/srep44738.
An extended meniscus of a ferrofluid solution on a silicon surface is subjected to axisymmetric, non-uniform magnetic field resulting in significant forward movement of the thin liquid film. Image analyzing interferometry is used for accurate measurement of the film thickness profile, which in turn, is used to determine the instantaneous slope and the curvature of the moving film. The recorded video, depicting the motion of the film in the Lagrangian frame of reference, is analyzed frame by frame, eliciting accurate information about the velocity and acceleration of the film at any instant of time. The application of the magnetic field has resulted in unique changes of the film profile in terms of significant non-uniform increase in the local film curvature. This was further analyzed by developing a model, taking into account the effect of changes in the magnetic and shape-dependent interfacial force fields.
硅表面上铁磁流体溶液的延伸半月板受到轴对称、不均匀磁场的作用,导致薄液膜显著向前移动。图像分析干涉法用于精确测量膜厚轮廓,进而用于确定运动膜的瞬时斜率和曲率。记录的视频描绘了在拉格朗日参考系中膜的运动,逐帧进行分析,得出关于膜在任何时刻的速度和加速度的准确信息。磁场的应用导致膜轮廓发生了独特的变化,局部膜曲率显著非均匀增加。通过开发一个模型,考虑到磁和形状相关界面力场变化的影响,进一步分析了这一现象。