Chess Jordan J, Montoya Sergio A, Harvey Tyler R, Ophus Colin, Couture Simon, Lomakin Vitaliy, Fullerton Eric E, McMorran Benjamin J
Department of Physics, University of Oregon, Eugene, OR 97403, USA.
Center for Memory and Recording Research, University of California, San Diego, CA 92093, USA; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093, USA.
Ultramicroscopy. 2017 Jun;177:78-83. doi: 10.1016/j.ultramic.2017.02.004. Epub 2017 Feb 28.
Recently, Lorentz transmission electron microscopy (LTEM) has helped researchers advance the emerging field of magnetic skyrmions. These magnetic quasi-particles, composed of topologically non-trivial magnetization textures, have a large potential for application as information carriers in low-power memory and logic devices. LTEM is one of a very few techniques for direct, real-space imaging of magnetic features at the nanoscale. For Fresnel-contrast LTEM, the transport of intensity equation (TIE) is the tool of choice for quantitative reconstruction of the local magnetic induction through the sample thickness. Typically, this analysis requires collection of at least three images. Here, we show that for uniform, thin, magnetic films, which includes many skyrmionic samples, the magnetic induction can be quantitatively determined from a single defocused image using a simplified TIE approach.
最近，洛伦兹透射电子显微镜（LTEM）助力研究人员推动了磁斯格明子这一新兴领域的发展。这些由拓扑非平凡磁化纹理构成的磁性准粒子，在低功耗存储器和逻辑器件中作为信息载体具有巨大的应用潜力。LTEM是极少数用于纳米级磁性特征直接实空间成像的技术之一。对于菲涅耳对比度LTEM，强度传输方程（TIE）是通过样品厚度定量重建局部磁感应强度的首选工具。通常，这种分析需要采集至少三张图像。在此，我们表明，对于包括许多斯格明子样品在内的均匀磁性薄膜，可以使用简化的TIE方法从单个散焦图像中定量确定磁感应强度。
