Li Ka, Feng Xue, Cui Kaiyu, Zhang Wei, Liu Fang, Huang Yidong
Appl Opt. 2017 Apr 10;56(11):3096-3103. doi: 10.1364/AO.56.003096.
We propose an integrated refractive index (RI) sensor based on evanescent field absorption (EFA) within a silicon slot waveguide, where the RI variation is translated into a varied attenuation coefficient and eventually the output power at the end of the waveguide. To demonstrate the operating principle of such a RI-EFA sensor, a specific structure is designed and discussed with numerical simulations. The calculated results indicate that the detection limit of our proposed RI-EFA sensor could be as good as ∼10 RIU for homogeneous sensing and ∼10 RIU for surface sensing with optimized structural parameters at a wavelength of 1064 nm. Since only a straight slot waveguide and optical power detection are required for our proposed sensor, we believe that it is promising to achieve an integrated and portable sensor on a single chip.
我们提出了一种基于硅槽波导内倏逝场吸收(EFA)的集成折射率(RI)传感器,其中折射率变化被转换为变化的衰减系数,并最终转换为波导末端的输出功率。为了证明这种RI-EFA传感器的工作原理,设计了一种特定结构并通过数值模拟进行了讨论。计算结果表明,在波长为1064 nm时,通过优化结构参数,我们提出的RI-EFA传感器的检测极限对于均匀传感可达约10 RIU,对于表面传感可达约10 RIU。由于我们提出的传感器仅需要一个直槽波导和光功率检测,我们相信在单个芯片上实现集成式便携式传感器具有很大的前景。