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电场诱导 Co/BiFeO 在 SrTiO 上磁易轴的可逆切换。

Electric-Field Induced Reversible Switching of the Magnetic Easy Axis in Co/BiFeO on SrTiO.

机构信息

Department of Materials Science and Engineering, University of Maryland , College Park, Maryland 20742, United States.

Portland Technology Development, Intel Corporation , Hillsboro, Oregon 97124, United States.

出版信息

Nano Lett. 2017 May 10;17(5):2825-2832. doi: 10.1021/acs.nanolett.6b05152. Epub 2017 Apr 20.

Abstract

Electric-field (E-field) control of magnetism enabled by multiferroic materials has the potential to revolutionize the landscape of present memory devices plagued with high energy dissipation. To date, this E-field controlled multiferroic scheme has only been demonstrated at room temperature using BiFeO films grown on DyScO, a unique and expensive substrate, which gives rise to a particular ferroelectric domain pattern in BiFeO. Here, we demonstrate reversible electric-field-induced switching of the magnetic state of the Co layer in Co/BiFeO (BFO) (001) thin film heterostructures fabricated on (001) SrTiO (STO) substrates. The angular dependence of the coercivity and the remanent magnetization of the Co layer indicates that its easy axis reversibly switches back and forth 45° between the (100) and the (110) crystallographic directions of STO as a result of alternating application of positive and negative voltage pulses between the patterned top Co electrode layer and the (001) SrRuO (SRO) layer on which the ferroelectric BFO is epitaxially grown. The coercivity (H) of the Co layer exhibits a hysteretic behavior between two states as a function of voltage. A mechanism based on the intrinsic magnetoelectric coupling in multiferroic BFO involving projection of antiferromagnetic G-type domains is used to explain the observation. We have also measured the exact canting angle of the G-type domain in strained BFO films for the first time using neutron diffraction. These results suggest a pathway to integrating BFO-based devices on Si wafers for implementing low power consumption and nonvolatile magnetoelectronic devices.

摘要

多铁材料实现的电场(E 场)控制磁体有潜力彻底改变目前受高能量耗散困扰的存储设备领域。迄今为止,这种 E 场控制的多铁方案仅在室温下使用生长在 DyScO 上的 BiFeO 薄膜得到证明,DyScO 是一种独特且昂贵的衬底,会在 BiFeO 中产生特定的铁电畴图案。在这里,我们展示了在(001)SrTiO(STO)衬底上制造的 Co/BiFeO(BFO)(001)薄膜异质结构中,Co 层的磁态可通过电场进行可逆切换。Co 层的矫顽力和剩余磁化强度的角度依赖性表明,其易轴由于在图案化的顶部 Co 电极层和外延生长铁电 BFO 的(001)SrRuO(SRO)层之间施加正、负电压脉冲,可在 STO 的(100)和(110)晶向之间来回可逆切换 45°。Co 层的矫顽力(H)作为电压的函数,表现出两个状态之间的滞后行为。我们使用基于多铁 BFO 中的本征磁电耦合的机制来解释这一观察结果,该机制涉及反铁磁 G 型畴的投影。我们还首次使用中子衍射测量了应变 BFO 薄膜中 G 型畴的精确倾斜角。这些结果为在 Si 晶圆上集成基于 BFO 的器件以实现低功耗和非易失性磁电子器件提供了一种途径。

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