通过正电子湮没寿命谱对掺杂稀土元素铒离子的碲酸盐玻璃70TeO-5XO-10PO-10ZnO-5PbF（X = Mg、Bi、Ti）的缺陷结构进行测量

Measurements of Defect Structures by Positron Annihilation Lifetime Spectroscopy of the Tellurite Glass 70TeO-5XO-10PO-10ZnO-5PbF (X = Mg, Bi, Ti) Doped with Ions of the Rare Earth Element Er.

作者信息

Pach K, Filipecki J, Golis E, Yousef El S, Boyko V

机构信息

Institute of Physics, Faculty of Mathematics and Natural Science, Jan Dlugosz University in Czestochowa, Al. Armii Krajowej 13/15, 42-200, Czestochowa, Poland.

Physics Dep., Faculty of Science, Al. - Azhar University, Assiut Branch, Assiut, Egypt.

出版信息

Nanoscale Res Lett. 2017 Dec;12(1):304. doi: 10.1186/s11671-017-2075-z. Epub 2017 Apr 26.

DOI:10.1186/s11671-017-2075-z

PMID:28449544

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC5406323/

Abstract

The objective of the study was the structural analysis of the 70TeO-5XO-10PO-10ZnO-5PbF (X = Mg, Bi, Ti) tellurite glasses doped with ions of the rare-earth elements Er, based on the PALS (positron annihilation lifetime spectroscopy) method of measuring positron lifetimes. Values of positron lifetimes and the corresponding intensities may be connected with the sizes and number of structural defects, the sizes of which range from a few angstroms to a few dozen nanometers. Experimental positron lifetime spectrum revealed existence of two positron lifetime components τ andτ . Their interpretation was based on two-state positron trapping model where the physical parameters are the positron annihilation rate and positron trapping rate.

摘要

本研究的目的是基于测量正电子寿命的正电子湮没寿命谱（PALS）方法，对掺杂稀土元素铒离子的70TeO-5XO-10PO-10ZnO-5PbF（X = Mg、Bi、Ti）碲酸盐玻璃进行结构分析。正电子寿命值及其相应强度可能与结构缺陷的尺寸和数量有关，其尺寸范围从几埃到几十纳米。实验得到的正电子寿命谱显示存在两个正电子寿命分量τ 和τ 。它们的解释基于双态正电子俘获模型，其中物理参数为正电子湮没率和正电子俘获率。