Möser J, Lips K, Tseytlin M, Eaton G R, Eaton S S, Schnegg A
Berlin Joint EPR Lab, Institut für Nanospektroskopie, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Kékuléstr. 5, 12489 Berlin, Germany.
Berlin Joint EPR Lab, Institut für Nanospektroskopie, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Kékuléstr. 5, 12489 Berlin, Germany.
J Magn Reson. 2017 Aug;281:17-25. doi: 10.1016/j.jmr.2017.04.003. Epub 2017 Apr 17.
X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for amorphous silicon powder samples. By comparing the resulting signal intensities the feasibility of performing quantitative rapid-scan EPR is demonstrated. For different hydrogenated amorphous silicon samples, rapid-scan EPR results in signal-to-noise improvements by factors between 10 and 50. Rapid-scan EPR is thus capable of improving the detection limit of quantitative EPR by at least one order of magnitude. In addition, we provide a recipe for setting up and calibrating a conventional pulsed and continuous-wave EPR spectrometer for rapid-scan EPR.
X波段快速扫描电子顺磁共振(EPR)是在一台市售的布鲁克ELEXSYS E580光谱仪上实现的。对非晶硅粉末样品记录了室温快速扫描和连续波EPR光谱。通过比较所得信号强度,证明了进行定量快速扫描EPR的可行性。对于不同的氢化非晶硅样品,快速扫描EPR使信噪比提高了10到50倍。因此,快速扫描EPR能够将定量EPR的检测限至少提高一个数量级。此外,我们提供了一套用于设置和校准传统脉冲和连续波EPR光谱仪以进行快速扫描EPR的方法。