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使用带有液体探针的原子力显微镜测量粗糙表面的粘附力。

Measuring adhesion on rough surfaces using atomic force microscopy with a liquid probe.

作者信息

Escobar Juan V, Garza Cristina, Castillo Rolando

机构信息

Instituto de Física, Universidad Nacional Autónoma de México; P. O. Box 20-364, DF, México, 01000, Mexico.

出版信息

Beilstein J Nanotechnol. 2017 Apr 10;8:813-825. doi: 10.3762/bjnano.8.84. eCollection 2017.

DOI:10.3762/bjnano.8.84
PMID:28503393
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC5405680/
Abstract

We present a procedure to perform and interpret pull-off force measurements during the jump-off-contact process between a liquid drop and rough surfaces using a conventional atomic force microscope. In this method, a micrometric liquid mercury drop is attached to an AFM tipless cantilever to measure the force required to pull this drop off a rough surface. We test the method with two surfaces: a square array of nanometer-sized peaks commonly used for the determination of AFM tip sharpness and a multi-scaled rough diamond surface containing sub-micrometer protrusions. Measurements are carried out in a nitrogen atmosphere to avoid water capillary interactions. We obtain information about the average force of adhesion between a single peak or protrusion and the liquid drop. This procedure could provide useful microscopic information to improve our understanding of wetting phenomena on rough surfaces.

摘要

我们提出了一种使用传统原子力显微镜在液滴与粗糙表面的脱离接触过程中进行并解释拉脱力测量的方法。在该方法中，将一个微米级的液态汞滴附着到原子力显微镜的无尖悬臂上，以测量将此液滴从粗糙表面拉脱所需的力。我们用两种表面测试了该方法：一种是常用于确定原子力显微镜针尖锐度的纳米级峰的方形阵列，另一种是包含亚微米级凸起的多尺度粗糙金刚石表面。测量在氮气气氛中进行，以避免水的毛细相互作用。我们获得了关于单个峰或凸起与液滴之间平均粘附力的信息。该方法可为增进我们对粗糙表面上润湿现象的理解提供有用的微观信息。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/64300d9599f5/Beilstein_J_Nanotechnol-08-813-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/6baff7d7bfa7/Beilstein_J_Nanotechnol-08-813-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/9093ae66b048/Beilstein_J_Nanotechnol-08-813-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/7d2f48683494/Beilstein_J_Nanotechnol-08-813-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/49029da18af8/Beilstein_J_Nanotechnol-08-813-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/2051c4d93772/Beilstein_J_Nanotechnol-08-813-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/421c620b55b8/Beilstein_J_Nanotechnol-08-813-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/223e37d88d92/Beilstein_J_Nanotechnol-08-813-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/f2c5b1e18b78/Beilstein_J_Nanotechnol-08-813-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/c8cee213ac3e/Beilstein_J_Nanotechnol-08-813-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/36fd81fb43ce/Beilstein_J_Nanotechnol-08-813-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/64300d9599f5/Beilstein_J_Nanotechnol-08-813-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/6baff7d7bfa7/Beilstein_J_Nanotechnol-08-813-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/9093ae66b048/Beilstein_J_Nanotechnol-08-813-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/7d2f48683494/Beilstein_J_Nanotechnol-08-813-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/49029da18af8/Beilstein_J_Nanotechnol-08-813-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/2051c4d93772/Beilstein_J_Nanotechnol-08-813-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/421c620b55b8/Beilstein_J_Nanotechnol-08-813-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/223e37d88d92/Beilstein_J_Nanotechnol-08-813-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/f2c5b1e18b78/Beilstein_J_Nanotechnol-08-813-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/c8cee213ac3e/Beilstein_J_Nanotechnol-08-813-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/36fd81fb43ce/Beilstein_J_Nanotechnol-08-813-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e87b/5405680/64300d9599f5/Beilstein_J_Nanotechnol-08-813-g012.jpg

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