Tewary V K, Quardokus Rebecca C, DelRio Frank W
Applied Chemicals and Materials Division, NIST, Boulder, CO 80305, USA.
Phys Lett A. 2016 Apr 29;380(20):1750-1756. doi: 10.1016/j.physleta.2016.03.021. Epub 2016 Mar 17.
A Green's function (GF) method is developed for interpreting scanning probe microscopy (SPM) measurements on new two-dimensional (2D) materials. GFs for the Laplace/Poisson equations are calculated by using a virtual source method for two separate cases of a finite material containing a rectangular defect and a hexagonal defect. The prescribed boundary values are reproduced almost exactly by the calculated GFs. It is suggested that the GF is not just a mathematical artefact but a basic physical characteristic of material systems, which can be measured directly by SPM for 2D solids. This should make SPM an even more powerful technique for characterization of 2D materials.
开发了一种格林函数（GF）方法，用于解释新型二维（2D）材料的扫描探针显微镜（SPM）测量结果。通过虚拟源方法，针对包含矩形缺陷和六边形缺陷的有限材料的两种不同情况，计算拉普拉斯/泊松方程的格林函数。计算得到的格林函数几乎能精确再现规定的边界值。研究表明，格林函数不仅仅是一种数学产物，而是材料系统的一种基本物理特性，对于二维固体，可以通过扫描探针显微镜直接测量。这将使扫描探针显微镜成为表征二维材料更强大的技术。
