Jelínek Pavel
Institute of Physics, Czech Academy of Sciences, Cukrovarnická 10, 162 00, Prague, Czech Republic.
J Phys Condens Matter. 2017 Aug 31;29(34):343002. doi: 10.1088/1361-648X/aa76c7. Epub 2017 Jul 27.
One of the most remarkable and exciting achievements in the field of scanning probe microscopy (SPM) in the last years is the unprecedented sub-molecular resolution of both atomic and electronic structures of single molecules deposited on solid state surfaces. Despite its youth, the technique has already brought many new possibilities to perform different kinds of measurements, which cannot be accomplished by other techniques. This opens new perspectives in advanced characterization of physical and chemical processes and properties of molecular structures on surfaces. Here, we discuss the history and recent progress of the high resolution imaging with a functionalized probe by means of atomic force microscopy (AFM), scanning tunnelling microscopy (STM) and inelastic electron tunneling spectroscopy (IETS). We describe the mechanisms responsible for the high-resolution AFM, STM and IETS-STM contrast. The complexity of this technique requires new theoretical approaches, where a relaxation of the functionalized probe is considered. We emphasise the similarities of the mechanism driving high-resolution SPM with other imaging methods. We also summarise briefly significant achievements and progress in different branches. Finally we provide brief perspectives and remaining challenges of the further refinement of these high-resolution methods.
近年来,扫描探针显微镜(SPM)领域最显著且令人兴奋的成就之一,是在固态表面沉积的单分子的原子结构和电子结构实现了前所未有的亚分子分辨率。尽管这项技术尚年轻,但它已经带来了许多进行不同类型测量的新可能性,而这些测量是其他技术无法完成的。这为表面分子结构的物理和化学过程及性质的先进表征开辟了新的视角。在此,我们讨论通过原子力显微镜(AFM)、扫描隧道显微镜(STM)和非弹性电子隧道谱(IETS)使用功能化探针进行高分辨率成像的历史和近期进展。我们描述了导致高分辨率AFM、STM和IETS - STM对比度的机制。这项技术的复杂性需要新的理论方法,其中要考虑功能化探针的弛豫。我们强调驱动高分辨率SPM的机制与其他成像方法的相似性。我们还简要总结了不同分支的重大成就和进展。最后,我们提供了这些高分辨率方法进一步完善的简要前景和 remaining challenges(此处原文“remaining challenges”未翻译完整,请确认具体含义以便准确翻译)。