Department of Physics, Northeastern University, Boston, MA, USA.
Laboratoire de Cristallographie et RMN Biologiques, UMR CNRS 8015, Université Paris Descartes, Sorbonne Paris Cité, Faculté de Pharmacie, 75006 Paris, France.
Nanoscale. 2017 Aug 10;9(31):11327-11337. doi: 10.1039/c7nr04231k.
The elasticity of double-stranded DNA (dsDNA), as described by its persistence length, is critical for many biological processes, including genomic regulation. A persistence length value can be obtained using atomic force microscopy (AFM) imaging. However, most AFM studies have been done by depositing the sample on a surface using adhesive ligands and fitting the contour to a two-dimensional (2D) wormlike chain (WLC) model. This often results in a persistence length measurement that is different from the value determined using bulk and single molecule methods. We describe a method for obtaining accurate three-dimensional (3D) persistence length measurements for DNA and DNA-protein complexes by using a previously developed liquid AFM imaging method and then applying the 3D WLC model. To demonstrate the method, we image in both air and liquid several different dsDNA constructs and DNA-protein complexes that both increase (HIV-1 Vpr) and decrease (yeast HMO1) dsDNA persistence length. Fitting the liquid AFM-imaging contour to the 3D WLC model results in a value in agreement with measurements obtained in optical tweezers experiments. Because AFM also allows characterization of local DNA properties, the ability to correctly measure global flexibility will strongly increase the impact of measurements that use AFM imaging.
双链 DNA(dsDNA)的弹性由其持久性长度来描述,这对许多生物过程都至关重要,包括基因组调控。使用原子力显微镜(AFM)成像可以获得持久性长度值。然而,大多数 AFM 研究都是通过使用粘性配体将样品沉积在表面上并将轮廓拟合到二维(2D)蠕虫链(WLC)模型来完成的。这通常会导致测量的持久性长度与使用体相和单分子方法确定的值不同。我们描述了一种通过使用先前开发的液体 AFM 成像方法并应用 3D WLC 模型来获得 DNA 和 DNA-蛋白质复合物的准确 3D 持久性长度测量的方法。为了验证该方法,我们在空气和液体中对几种不同的 dsDNA 结构和增加(HIV-1 Vpr)和降低(酵母 HMO1)dsDNA 持久性长度的 DNA-蛋白质复合物进行成像。将液体 AFM 成像轮廓拟合到 3D WLC 模型会得到与光学镊子实验获得的测量值一致的值。由于 AFM 还允许对局部 DNA 特性进行表征,因此正确测量整体柔韧性的能力将大大提高使用 AFM 成像进行测量的效果。