SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay , 91191 Gif-sur-Yvette Cedex, France.
Institut Jean Lamour, UMR 7198 CNRS/Université de Lorraine , 54056 Vandœuvre-lès-Nancy, France.
ACS Appl Mater Interfaces. 2017 Aug 30;9(34):29311-29317. doi: 10.1021/acsami.7b08925. Epub 2017 Aug 16.
We present a study of adsorbate screening of surface charge in microscopic ferroelectric domains in a sol-gel grown PbZrTiO thin film. Low-energy and photoemission electron microscopies were employed to characterize the temperature dependence of surface charge and polarization of ferroelectric domains written by atomic force microscopy. We study the role of charged adsorbates in screening of polarization-bound charges. We demonstrate that full-field electron microscopy is suitable for the determination of ferroelectric system properties such as the Curie temperature.
我们研究了在溶胶-凝胶生长的 PbZrTiO 薄膜中微观铁电畴中表面电荷的吸附体屏蔽。我们采用低能和光电子显微镜来表征由原子力显微镜写入的铁电畴的表面电荷和极化随温度的变化。我们研究了带电吸附体在屏蔽极化束缚电荷中的作用。我们证明了全场电子显微镜适合于确定铁电系统的性质，如居里温度。
