School of Electrical & Electronic Engineering, Tianjin Key Laboratory of Film Electronic & Communication Devices, Tianjin University of Technology , Tianjin, 300384, China.
ACS Appl Mater Interfaces. 2017 Oct 18;9(41):36009-36016. doi: 10.1021/acsami.7b10693. Epub 2017 Oct 3.
Atomically thin, two-dimensional material molybdenum diselenide (MoSe) has been shown to exhibit significant potential for diverse applications. The intrinsic band gap of MoSe allows it to overcome the shortcomings of the zero-band-gap graphene, while its higher electron mobilities when compared to molybdenum disulfide (MoS) make it more appropriate for practical devices in electronics and optoelectronics. However, its controlled growth has been an ongoing challenge for investigations and practical applications of the material. Here, we present an atmospheric pressure chemical vapor deposition (CVD) method to achieve highly crystalline, single- and few-layered MoSe using a SiO/Si substrate. Our findings suggested that careful optimization of the flow rate can result in the controlled growth of large-area MoSe with desired layer numbers due to the adjustment of gaseous MoSe partial pressure and nucleation density. The FETs fabricated on such as-synthesized MoSe displayed different transport behaviors depending on the layer numbers, which can be attributed to the formation of Se vacancies generated during low flow rates. Monolayer MoSe showed n-type characteristics with an I/I ratio of ∼10 and a carrier mobility of ∼19 cm V s, whereas bilayer MoSe showed n-type-dominant ambipolar behavior with an I/I ratio of ∼10 and a higher mobility of ∼65 cm V s for electrons as well as ∼9 cm V s for holes. Our results provide a foundation for property-controlled synthesis of MoSe and offer insight on the potential applications of our synthesized MoSe in electronics and optoelectronics.
原子级薄的二维材料二硒化钼(MoSe)已经显示出在多种应用中具有显著的潜力。MoSe 的本征带隙使其能够克服零带隙石墨烯的缺点,而与二硫化钼(MoS)相比,其更高的电子迁移率使其更适合电子学和光电子学中的实际器件。然而,其可控生长一直是该材料研究和实际应用的挑战。在这里,我们提出了一种在 SiO2/Si 衬底上利用常压化学气相沉积(CVD)方法实现高结晶、单层和少层 MoSe 的方法。我们的研究结果表明,通过仔细优化流速,可以由于调节气态 MoSe 分压和形核密度,实现大面积 MoSe 的可控生长,具有所需的层数。在这种合成的 MoSe 上制造的 FET 显示出不同的传输行为,这取决于层数,这可以归因于在低流速下形成的 Se 空位。单层 MoSe 表现出 n 型特性,I/I 比约为 10,载流子迁移率约为 19 cm V s,而双层 MoSe 表现出 n 型主导的双极性行为,I/I 比约为 10,电子迁移率约为 65 cm V s,空穴迁移率约为 9 cm V s。我们的结果为 MoSe 的性能控制合成提供了基础,并为我们合成的 MoSe 在电子学和光电子学中的潜在应用提供了深入的了解。