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电子-声子散射对硅纳米结构晶格热导率的影响。

Electron-phonon scattering effect on the lattice thermal conductivity of silicon nanostructures.

作者信息

Fu Bo, Tang Guihua, Li Yifei

机构信息

MOE Key Laboratory of Thermo-Fluid Science and Engineering, School of Energy and Power Engineering, Xi'an Jiaotong University, Xi'an 710049, China.

出版信息

Phys Chem Chem Phys. 2017 Nov 1;19(42):28517-28526. doi: 10.1039/c7cp04638c.

Abstract

Nanostructuring technology has been widely employed to reduce the thermal conductivity of thermoelectric materials because of the strong phonon-boundary scattering. Optimizing the carrier concentration can not only improve the electrical properties, but also affect the lattice thermal conductivity significantly due to the electron-phonon scattering. The lattice thermal conductivity of silicon nanostructures considering electron-phonon scattering is investigated for comparing the lattice thermal conductivity reductions resulting from nanostructuring technology and the carrier concentration optimization. We performed frequency-dependent simulations of thermal transport systematically in nanowires, solid thin films and nanoporous thin films by solving the phonon Boltzmann transport equation using the discrete ordinate method. All the phonon properties are based on the first-principles calculations. The results show that the lattice thermal conductivity reduction due to the electron-phonon scattering decreases as the feature size of nanostructures goes down and could be ignored at low feature sizes (50 nm for n-type nanowires and 20 nm for p-type nanowires and n-type solid thin films) or a high porosity (0.6 for n-type 500 nm-thick nanoporous thin films) even when the carrier concentration is as high as 10 cm. Similarly, the size effect due to the phonon-boundary scattering also becomes less significant with the increase of carrier concentration. The findings provide a fundamental understanding of electron and phonon transports in nanostructures, which is important for the optimization of nanostructured thermoelectric materials.

摘要

由于强烈的声子-边界散射,纳米结构化技术已被广泛用于降低热电材料的热导率。优化载流子浓度不仅可以改善电学性能,还会因电子-声子散射而显著影响晶格热导率。为了比较纳米结构化技术和载流子浓度优化所导致的晶格热导率降低情况,研究了考虑电子-声子散射的硅纳米结构的晶格热导率。我们通过使用离散坐标法求解声子玻尔兹曼输运方程,系统地对纳米线、固体薄膜和纳米多孔薄膜中的热输运进行了频率相关的模拟。所有声子特性均基于第一性原理计算。结果表明,由于电子-声子散射导致的晶格热导率降低随着纳米结构特征尺寸的减小而减小,并且在低特征尺寸(n型纳米线为50 nm,p型纳米线和n型固体薄膜为20 nm)或高孔隙率(n型500 nm厚纳米多孔薄膜为0.6)时可以忽略不计,即使载流子浓度高达10 cm。同样,随着载流子浓度的增加,声子-边界散射引起的尺寸效应也变得不那么显著。这些发现为纳米结构中的电子和声子输运提供了基本的理解,这对于优化纳米结构热电材料很重要。

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