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克服基于KAM的塑性应变估计的缺点。

Overcoming the drawbacks of plastic strain estimation based on KAM.

作者信息

Shen Rickard R, Efsing Pål

机构信息

Department of Solid Mechanics, KTH Royal Institute of Technology, Teknikringen 8D, Stockholm, SE-100 44, Sweden.

Department of Solid Mechanics, KTH Royal Institute of Technology, Teknikringen 8D, Stockholm, SE-100 44, Sweden; Ringhals AB, Ringhalsverket, Väröbacka, SE-432 85, Sweden.

出版信息

Ultramicroscopy. 2018 Jan;184(Pt A):156-163. doi: 10.1016/j.ultramic.2017.08.013. Epub 2017 Aug 31.

DOI:10.1016/j.ultramic.2017.08.013
PMID:28910682
Abstract

Plastic strain estimation using electron backscatter diffraction (EBSD) based on kernel average misorientation (KAM) is affected by random orientation measurement error, EBSD step length, choice of kernel and average grain size. These sensitivities complicate reproducibility of results between labs, but it is shown in this work how these drawbacks can be overcome. The modifications to KAM were verified against a similar misorientation metric based on grain orientation spread (GOS), which does not show sensitivity to these factors. Both metrics were used in parallel to estimate the plastic strain distribution in Alloy 690 heat affected zones from component mockups, and showed the same results where the grain size was correctly compensated for.

摘要

基于内核平均取向差(KAM),利用电子背散射衍射(EBSD)进行塑性应变估计会受到随机取向测量误差、EBSD步长、内核选择和平均晶粒尺寸的影响。这些敏感性使得实验室之间结果的可重复性变得复杂,但这项工作展示了如何克服这些缺点。针对基于晶粒取向扩展(GOS)的类似取向差度量对KAM的修改进行了验证,该度量对这些因素不敏感。两种度量并行用于估计来自部件模型的690合金热影响区的塑性应变分布,并且在晶粒尺寸得到正确补偿的情况下显示出相同的结果。

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