Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, No. 3 BeiTuCheng West Road, ChaoYang District, Beijing 100029, China.
Nanoscale. 2017 Oct 5;9(38):14442-14450. doi: 10.1039/c7nr04741j.
Seeking an effective electronic synapse to emulate biological synaptic behavior is fundamental for building brain-inspired computers. An emerging two-terminal memristor, in which the conductance can be gradually modulated by external electrical stimuli, is widely considered as the strongest competitor of the electronic synapse. Here, we show the capability of TiO/AlO-based memristor devices to imitate synaptic behaviors. Along with analog resistive switching performances, the devices replicate the bio-synapse behaviors of potentiation/depression, short-term-plasticity, and long-term-potentiation, which show that TiO/AlO-based memristors may be useful as electronic synapses. The essential memorizing capabilities of the brain are dependent on the connection strength between neurons, and the memory types change from short-term memory to long-term memory. In the TiO/AlO-based electronic synaptic junction, the memorizing levels can change their state via a standard rehearsal process and also via newly introduced process called "impact of event" i.e. the impact of pulse amplitude, and the width of the input pulse. The devices show a short-term to long-term memory effect with the introduction of intermediate mezzanine memory. The experimental achievements using the TiO/AlO electronic synapses are finally psychologically modeled by considering the mezzanine level. It is highly recommended that similar phenomena should be investigated for other memristor systems to check the authenticity of this model.
寻找能够模拟生物突触行为的有效电子突触对于构建类脑计算机至关重要。一种新兴的二端忆阻器,其电导可以通过外部电刺激逐渐调制,被广泛认为是电子突触的最强竞争者。在这里,我们展示了基于 TiO/AlO 的忆阻器器件模拟突触行为的能力。除了模拟电阻开关性能外,该器件还复制了突触的增强/抑制、短期可塑性和长期增强等生物突触行为,这表明 TiO/AlO 基忆阻器可用作电子突触。大脑的基本记忆能力取决于神经元之间的连接强度,记忆类型从短期记忆转变为长期记忆。在基于 TiO/AlO 的电子突触结中,通过标准的排练过程和新引入的“事件冲击”过程(即输入脉冲的幅度和宽度的影响)可以改变记忆状态。通过引入中间夹层存储器,器件显示出短期到长期的记忆效应。最后,通过考虑中间层水平,使用 TiO/AlO 电子突触进行了心理建模实验。强烈建议对其他忆阻器系统进行类似的研究,以检查该模型的真实性。