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用于从深紫外到近红外的高性能MoS/Si异质结宽带光电探测器。

High-performance MoS/Si heterojunction broadband photodetectors from deep ultraviolet to near infrared.

作者信息

Lou Zhenhua, Zeng Longhui, Wang Yuange, Wu Di, Xu Tingting, Shi Zhifeng, Tian Yongtao, Li Xinjian, Tsang Yuen Hong

出版信息

Opt Lett. 2017 Sep 1;42(17):3335-3338. doi: 10.1364/OL.42.003335.

Abstract

Polycrystalline 2D layered molybdenum disulfide (MoS) films were synthesized via a thermal decomposition method. The MoS/Si heterostructures were constructed in situ by synthesis MoS on plane Si substrates. Such MoS/Si heterostructures exhibited high sensitivity to light illumination with wavelengths ranging from the deep ultraviolet to the near infrared. Photoresponse analysis reveals that a high responsivity of 23.1 A/W, a specific detectivity of 1.63×10 Jones, and a fast response speed of 21.6/65.5 μs were achieved. Notably, the MoS/Si heterojunction photodetector could operate with excellent stability and repeatability over a wide frequency range up to 150 kHz. The high performance could be attributed to the high-quality heterojunction between MoS and Si obtained by the in situ fabrication process. Such high performance with broadband response suggests that MoS/Si heterostructures could have great potential in optoelectronic applications.

摘要

通过热分解法合成了多晶二维层状二硫化钼(MoS)薄膜。通过在平面硅衬底上原位合成MoS构建了MoS/Si异质结构。这种MoS/Si异质结构对从深紫外到近红外波长的光照表现出高灵敏度。光响应分析表明,实现了23.1 A/W的高响应度、1.63×10琼斯的比探测率以及21.6/65.5 μs的快速响应速度。值得注意的是,MoS/Si异质结光电探测器在高达150 kHz的宽频率范围内能够以优异的稳定性和重复性运行。高性能可归因于通过原位制备工艺获得的MoS和Si之间的高质量异质结。这种具有宽带响应的高性能表明MoS/Si异质结构在光电子应用中具有巨大潜力。

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