Gonzalez J F, Somoza A M, Palacios-Lidón E
Biomedical Science, Faculty of Health and Society, Malmö University, 20506 Malmö, Sweden.
Phys Chem Chem Phys. 2017 Oct 18;19(40):27299-27304. doi: 10.1039/c7cp05401g.
Inferring the surface charge distribution from experimental Kelvin probe microscopy measurements is usually a hard task. Although several approximations have been proposed in order to estimate the effect of these charges, the real inverse problem has not been addressed so far. In this paper, we propose a fast and intuitive method based on Fast Fourier Transform algorithms that allows the surface charge distribution to be obtained directly from the experimental Kelvin voltage measurements. With this method, quantitative physical information such as the total charge and charge position is accessible even in complex charge distributions such as highly insulating polymer surfaces. Moreover, one of the strongest points is that sub-tip resolution is achieved, and therefore the usually unknown charge size can be estimated.
从实验开尔文探针显微镜测量中推断表面电荷分布通常是一项艰巨的任务。尽管已经提出了几种近似方法来估计这些电荷的影响，但到目前为止，尚未解决真正的反问题。在本文中，我们提出了一种基于快速傅里叶变换算法的快速直观方法，该方法可以直接从实验开尔文电压测量中获得表面电荷分布。使用这种方法，即使在诸如高度绝缘聚合物表面等复杂电荷分布中，也可以获取诸如总电荷和电荷位置等定量物理信息。此外，最突出的一点是实现了亚尖端分辨率，因此可以估计通常未知的电荷大小。
