Dep. de Física-CIOyN, Universidad de Murcia, E-30100 Murcia, Spain.
Nanotechnology. 2017 Jan 13;28(2):025703. doi: 10.1088/1361-6528/28/2/025703. Epub 2016 Dec 6.
In this work, we propose an intuitive and easily implementable approach to model and interpret scanning Kelvin probe microscopy images of insulating samples with localized charges. The method, based on the image charges method, has been validated by a systematic comparison of its predictions with experimental measurements performed on charge domains of different sizes, injected in polymethyl methacrylate discontinuous films. The agreement between predictions and experimental lateral profiles, as well as with spectroscopy tip-sample distance curves, supports its consistency. The proposed procedure allows obtaining quantitative information such as total charge and the size of a charge domain and allows estimating the most adequate measurement parameters.
在这项工作中，我们提出了一种直观且易于实现的方法，用于对带有局部电荷的绝缘样品的扫描开尔文探针显微镜图像进行建模和解释。该方法基于像电荷方法，通过与在聚甲基丙烯酸甲酯不连续薄膜中注入的不同大小的电荷畴进行实验测量的预测进行系统比较，验证了其有效性。预测与实验横向轮廓以及光谱针尖-样品距离曲线之间的一致性支持了其一致性。所提出的程序允许获得总电荷和电荷畴大小等定量信息，并允许估计最合适的测量参数。
