Vodolazskaya I V, Tarasevich Yu Yu
Astrakhan State University, Astrakhan, Russia.
Eur Phys J E Soft Matter. 2017 Oct;40(10):83. doi: 10.1140/epje/i2017-11574-8. Epub 2017 Oct 5.
In this work, a model is developed for investigating the redistribution of colloidal particles in the film of an aqueous solution evaporating on a solid horizontal substrate under a mask with holes. Considering the characteristic horizontal film size as large and taking into account the symmetry in the arrangement of the holes in the mask the problem is solved for one film cell under a mask with a hole in its center. It is believed that vapour passes into the atmosphere only through the hole in the mask, the vapor flux density is calculated on the basis of the equation of steady-state diffusion of vapor in the atmosphere. The height-averaged velocity and volume fraction of colloidal particles are calculated using the conservation of mass, taking into account diffusion and deposition of particles onto the substrate. The calculation is performed using FlexPDE. We study the effect of the ratio of hole radius to hole spacing, the distance between the film and the mask, the diffusion, the deposition, the initial volume fraction of particles on the redistribution of particles in solution and on the substrate at the initial stage of film drying. These studies have shown that the behavior of the redistribution of particles in the solution and on the substrate depends primarily on the distance between the film and the mask, on the ratio of hole radius to hole spacing, on the diffusion coefficient of the particles. These parameters determine whether the particles will accumulate under the holes in the mask or will be distributed uniformly. The results agree with the experimental data.
在这项工作中,开发了一个模型,用于研究在带有孔的掩膜下,水平固体基板上蒸发的水溶液薄膜中胶体颗粒的重新分布情况。考虑到水平薄膜尺寸较大,并考虑到掩膜中孔排列的对称性,针对掩膜中心有一个孔的一个薄膜单元求解该问题。假定蒸汽仅通过掩膜上的孔进入大气,蒸汽通量密度根据大气中蒸汽稳态扩散方程计算得出。考虑到颗粒在基板上的扩散和沉积,利用质量守恒计算胶体颗粒的高度平均速度和体积分数。计算使用FlexPDE进行。我们研究了孔半径与孔间距之比、薄膜与掩膜之间的距离、扩散、沉积、颗粒初始体积分数对薄膜干燥初始阶段溶液中和基板上颗粒重新分布的影响。这些研究表明,溶液中和基板上颗粒重新分布的行为主要取决于薄膜与掩膜之间的距离、孔半径与孔间距之比以及颗粒的扩散系数。这些参数决定了颗粒是会在掩膜下的孔处聚集还是会均匀分布。结果与实验数据相符。