Ferron Thomas, Pope Michael, Collins Brian A
Department of Physics and Astronomy, Washington State University, Pullman, Washington 99164, USA.
Phys Rev Lett. 2017 Oct 20;119(16):167801. doi: 10.1103/PhysRevLett.119.167801. Epub 2017 Oct 19.
Interfaces are of critical importance to many materials and phenomena yet are difficult to probe. This difficulty is compounded in three-dimensional nanostructures and with delicate organic materials. Here we demonstrate a quantitative spectral analysis of resonant soft x-ray scattering that can accurately measure properties of buried nonplanar interfaces within polymeric systems. We measure the scattering invariant on an absolute scale to quantify the interfacial volume and width involved in mixing at the interface of block copolymer nanostructures. Using continuous contrast tuning, this spectral analysis enables the separation and identification of any number of unique scatterers in complex nanostructures.
界面对于许多材料和现象至关重要，但却难以探测。在三维纳米结构以及精细的有机材料中，这种困难更加复杂。在这里，我们展示了一种共振软X射线散射的定量光谱分析方法，它能够精确测量聚合物体系中埋藏的非平面界面的性质。我们在绝对尺度上测量散射不变量，以量化嵌段共聚物纳米结构界面处混合所涉及的界面体积和宽度。通过连续的对比度调节，这种光谱分析能够分离和识别复杂纳米结构中任意数量的独特散射体。
