Egerton R F
Department of Physics, University of Alberta, Edmonton, Canada T6G 2E1.
Microscopy (Oxf). 2018 Mar 1;67(suppl_1):i52-i59. doi: 10.1093/jmicro/dfx089.
We have previously derived an analytical formula for the point spread function (PSF) that describes the delocalization of low-loss inelastic scattering. Here, we modify the formula to take account variation of scattered-electron phase. The exponentially attenuated Lorentzian form is retained but its halfwidth at half maximum is chosen to provide better agreement with measurements of the median delocalization distance. For low energy losses, the 1/r2 tails of the PSF extend beyond the region of energy deposition, allowing a small-diameter electron probe to provide energy-loss data from relatively undamaged regions of a beam-sensitive specimen. Alternatively, a core-loss or elastic image can be recorded with less damage by sparse scanning, as in scanned moiré imaging. A procedure is proposed for directly measuring the PSF, using a TEM with aberration-corrected lenses and an energy-filtered imaging system.
我们之前推导了一个用于描述低损耗非弹性散射离域化的点扩散函数(PSF)的解析公式。在此,我们对该公式进行修改以考虑散射电子相位的变化。指数衰减的洛伦兹形式得以保留,但其半高宽的选取是为了与中位离域化距离的测量结果取得更好的一致性。对于低能量损失,PSF的1/r²尾部延伸到能量沉积区域之外,这使得小直径电子探针能够从对束敏感的样品的相对未受损区域提供能量损失数据。或者,如在扫描莫尔成像中那样,通过稀疏扫描可以记录损伤较小的芯损或弹性图像。本文提出了一种使用带有像差校正透镜的透射电子显微镜(TEM)和能量过滤成像系统直接测量PSF的方法。