Nørgaard Kren Rahbek, Fernandez-Grande Efren, Laugesen Søren
Acoustic Technology, Department of Electrical Engineering, Technical University of Denmark, Ørsteds Plads, Building 352, Kongens Lyngby, DK-2800, Denmark.
Interacoustics Research Unit, Technical University of Denmark, Ørsteds Plads, Building 352, Kongens Lyngby, DK-2800, Denmark.
J Acoust Soc Am. 2017 Dec;142(6):3497. doi: 10.1121/1.5016808.
The ear-canal acoustic impedance and reflectance are useful for assessing conductive hearing disorders and calibrating stimulus levels in situ. However, such probe-based measurements are affected by errors due to the presence of evanescent modes and incorrect estimates or assumptions regarding characteristic impedance. This paper proposes a method to compensate for evanescent modes in measurements of acoustic impedance, reflectance, and sound pressure in waveguides, as well as estimating the characteristic impedance immediately in front of the probe. This is achieved by adjusting the characteristic impedance and subtracting an acoustic inertance from the measured impedance such that the non-causality in the reflectance is minimized in the frequency domain using the Hilbert transform. The method is thus capable of estimating plane-wave quantities of the sought-for parameters by supplying only an arbitrary initial value for the characteristic impedance. From a comparison with a simulated waveguide, it is shown that this method can accurately estimate these quantities in a waveguide that is uniform at the position of the probe. Finally, it is demonstrated how evanescent modes, characteristic impedance, and the proposed methodology can affect the measured acoustic impedance and reflectance of an occluded-ear simulator.
耳道声阻抗和反射率对于评估传导性听力障碍以及原位校准刺激水平很有用。然而,由于倏逝模式的存在以及关于特性阻抗的错误估计或假设,这种基于探头的测量会受到误差的影响。本文提出了一种方法,用于补偿波导中声阻抗、反射率和声压测量中的倏逝模式,以及立即估计探头正前方的特性阻抗。这是通过调整特性阻抗并从测量阻抗中减去声惯性来实现的,以便使用希尔伯特变换在频域中将反射率中的非因果性最小化。因此,该方法能够通过仅为特性阻抗提供一个任意初始值来估计所需参数的平面波量。通过与模拟波导进行比较表明,该方法可以在探头位置均匀的波导中准确估计这些量。最后,展示了倏逝模式、特性阻抗和所提出的方法如何影响被阻塞耳模拟器的测量声阻抗和反射率。