Chen Zhou, Chen Weiqiu, Song Jizhou
Department of Engineering Mechanics, Soft Matter Research Center, and Key Laboratory of Soft Machines and Smart Devices of Zhejiang Province, Zhejiang University, Hangzhou 310027, People's Republic of China.
Proc Math Phys Eng Sci. 2017 Dec;473(2208):20170410. doi: 10.1098/rspa.2017.0410. Epub 2017 Dec 13.
The buckling of a stiff film on a compliant substrate has attracted much attention due to its wide applications such as thin-film metrology, surface patterning and stretchable electronics. An analytical model is established for the buckling of a stiff thin film on a semi-infinite elastic graded compliant substrate subjected to in-plane compression. The critical compressive strain and buckling wavelength for the sinusoidal mode are obtained analytically for the case with the substrate modulus decaying exponentially. The rigorous finite element analysis (FEA) is performed to validate the analytical model and investigate the postbuckling behaviour of the system. The critical buckling strain for the period-doubling mode is obtained numerically. The influences of various material parameters on the results are investigated. These results are helpful to provide physical insights on the buckling of elastic graded substrate-supported thin film.
由于其在薄膜计量、表面图案化和可拉伸电子学等广泛应用，刚性薄膜在柔性衬底上的屈曲受到了广泛关注。建立了一个分析模型，用于研究在平面内压缩作用下，半无限弹性梯度柔性衬底上刚性薄膜的屈曲。对于衬底模量呈指数衰减的情况，解析地得到了正弦模式的临界压缩应变和屈曲波长。进行了严格的有限元分析（FEA）以验证分析模型并研究系统的屈曲后行为。通过数值方法得到了倍周期模式的临界屈曲应变。研究了各种材料参数对结果的影响。这些结果有助于深入了解弹性梯度衬底支撑薄膜的屈曲现象。
