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柔性基底上后屈曲薄膜的振动分析

Vibration Analysis of Post-Buckled Thin Film on Compliant Substrates.

作者信息

Fan Xuanqing, Wang Yi, Li Yuhang, Fu Haoran

机构信息

Institute of Solid Mechanics, Beihang University (BUAA), Beijing 100191, China.

Aircraft and Propulsion Laboratory, Ningbo Institute of Technology, Beihang University, Ningbo 315800, China.

出版信息

Sensors (Basel). 2020 Sep 22;20(18):5425. doi: 10.3390/s20185425.

Abstract

Buckling stability of thin films on compliant substrates is universal and essential in stretchable electronics. The dynamic behaviors of this special system are unavoidable when the stretchable electronics are in real applications. In this paper, an analytical model is established to investigate the vibration of post-buckled thin films on a compliant substrate by accounting for the substrate as an elastic foundation. The analytical predictions of natural frequencies and vibration modes of the system are systematically investigated. The results may serve as guidance for the dynamic design of the thin film on compliant substrates to avoid resonance in the noise environment.

摘要

柔性衬底上薄膜的屈曲稳定性在可拉伸电子学中具有普遍性和至关重要性。当可拉伸电子器件在实际应用中时,这个特殊系统的动态行为是不可避免的。本文建立了一个分析模型,通过将衬底视为弹性基础来研究柔性衬底上后屈曲薄膜的振动。系统地研究了该系统固有频率和振动模式的分析预测。这些结果可为柔性衬底上薄膜的动态设计提供指导,以避免在噪声环境中发生共振。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/62f8/7570711/465c00044ec8/sensors-20-05425-g001.jpg

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