一个用于在透射电子显微镜（TEM）或扫描透射电子显微镜（STEM）中对薄样品进行专用能量色散微分析的BASIC语言程序。
A BASIC-language program for dedicated energy-dispersive microanalysis of thin samples in TEM or STEM.
作者信息
Russ J C
出版信息
Microsc Acta Suppl. 1978(2):217-27.
PMID:293476
Abstract
The program QTHIN combines those methods for processing energy-dispersive X-ray spectra and computing concentrations best suited to thin section microanalysis in TEM or STEM. The program is in BASIC, and so can be modified (for instance for unusual geometries, other matrices such as oxides, etc.). It is suitable for routine use on complex samples with peak overlaps, and for "not-so-thin" samples in which absorption is not negligible.
摘要
QTHIN程序结合了那些用于处理能量色散X射线光谱以及计算浓度的方法，这些方法最适合用于透射电子显微镜（TEM）或扫描透射电子显微镜（STEM）中的薄片微分析。该程序用BASIC语言编写，因此可以修改（例如针对特殊几何形状、其他基质如氧化物等）。它适用于对具有峰重叠的复杂样品进行常规分析，也适用于吸收不可忽略的“不太薄”的样品。
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