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通过泄漏辐射显微镜对表面等离子体耦合发射进行直接成像。

Direct image of surface-plasmon-coupled emission by leakage radiation microscopy.

作者信息

Zhang Douguo, Yuan Xiaocong, Bouhelier Alexandre

机构信息

School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798.

出版信息

Appl Opt. 2010 Feb 10;49(5):875-9. doi: 10.1364/AO.49.000875.

Abstract

Leakage radiation microscopy (LRM) is used to directly image surface-plasmon-coupled emission (SPCE). When compared with the prism-based setup commonly used in SPCE research, LRM has the advantages of directly giving out the emitting direction without angle scanning, and the image generated of surface plasmon polariton (SPPs) propagation, which helps to understand the optical process of SPCE. LRM also can give a clearer SPCE image than that obtained by a prism-based setup. Based on the LRM, we find that the SPCE pattern and propagation of SPPs can be modified by the shape of PMMA films containing fluorescence molecules.

摘要

泄漏辐射显微镜(LRM)用于直接成像表面等离子体耦合发射(SPCE)。与SPCE研究中常用的基于棱镜的装置相比,LRM具有无需角度扫描即可直接给出发射方向的优点,以及生成表面等离子体激元(SPP)传播图像的优点,这有助于理解SPCE的光学过程。LRM还能给出比基于棱镜的装置更清晰的SPCE图像。基于LRM,我们发现含有荧光分子的聚甲基丙烯酸甲酯(PMMA)薄膜的形状可以改变SPCE图案和SPP的传播。

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