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通过熔体淬火在BiO/TiO/SiO/NdO/AlO玻璃陶瓷中生长取向的BiTiO层。

Growing Oriented Layers of BiTiO in BiO/TiO/SiO/NdO/AlO Glass-Ceramics by Melt Quenching.

作者信息

Wisniewski Wolfgang, Slavov Stanislav, Rüssel Christian, Dimitriev Yanko

机构信息

Otto-Schott-Institut, Jena University, Fraunhoferstr. 6, 07743, Jena, Germany.

University of Chemical Technology and Metallurgy, Department of Physics, 8 Kl. Ohridski Blvd, 1756, Sofia, Bulgaria.

出版信息

Sci Rep. 2018 Jun 5;8(1):8639. doi: 10.1038/s41598-018-26876-6.

Abstract

A glass melt with the composition 24BiO/40TiO/10SiO/10NdO/16 AlO was prepared and rapidly quenched between two copper blocks (sample A). A part of this glass was subsequently crystallised at 800 °C for 8 h (sample B). For the preparation of another two samples, the melt was slowly cooled on a cooper plate (sample C) or cast into a graphite mould and subsequently thermally treated at 300 °C for 3 h (sample D). As shown by X-ray diffraction (XRD) and scanning electron microscopy (SEM) including energy dispersive X-ray spectroscopy (EDXS) and electron backscatter diffraction (EBSD) measurements, the rapidly cooled samples contained notable amounts of uncrystallised glassy phase next to the Aurivillius phase BiTiO. The latter occurred in higher concentrations in all other samples and formed oriented layers. Minor concentrations of BiAlO and AlO were also detected in the microstructure.

摘要

制备了一种成分是24BiO/40TiO/10SiO/10NdO/16AlO的玻璃熔体,并在两个铜块之间快速淬火(样品A)。随后将该玻璃的一部分在800 °C下结晶8小时(样品B)。为了制备另外两个样品,将熔体在铜板上缓慢冷却(样品C)或浇铸到石墨模具中,随后在300 °C下进行3小时的热处理(样品D)。如X射线衍射(XRD)和扫描电子显微镜(SEM)(包括能量色散X射线光谱(EDXS)和电子背散射衍射(EBSD)测量)所示,快速冷却的样品在钙钛矿结构的铋层状氧化物相BiTiO旁边含有大量未结晶的玻璃相。在所有其他样品中,后者以更高的浓度出现并形成取向层。在微观结构中还检测到少量的BiAlO和AlO。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/09b3/5988683/f8f268d66828/41598_2018_26876_Fig1_HTML.jpg

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