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easySLM-STED:具有像差校正、扩展视场和多光束扫描的受激发射损耗显微镜。

easySLM-STED: Stimulated emission depletion microscopy with aberration correction, extended field of view and multiple beam scanning.

机构信息

Photonics Group, Department of Physics, Imperial College London, London, UK.

Femtosecond Optics Group, Department of Physics, Imperial College London, London, UK.

出版信息

J Biophotonics. 2018 Nov;11(11):e201800087. doi: 10.1002/jbio.201800087. Epub 2018 Jul 31.

DOI:10.1002/jbio.201800087
PMID:29978591
Abstract

We demonstrate a simplified set-up for STED microscopy with a straightforward alignment procedure that uses a single spatial light modulator (SLM) with collinear incident excitation and depletion beams to provide phase modulation of the beam profiles and correction of optical aberrations. We show that this approach can be used to extend the field of view for STED microscopy by correcting chromatic aberration that otherwise leads to walk-off between the focused excitation and depletion beams. We further show how this arrangement can be adapted to increase the imaging speed through multibeam excitation and depletion. Fine adjustments to the alignment can be accomplished using the SLM only, conferring the potential for automation.

摘要

我们展示了一种简化的 STED 显微镜设置,采用了一种简单的对准方法,该方法使用单个空间光调制器 (SLM) 与共线入射激发和耗尽光束一起提供光束轮廓的相位调制和对像差的校正。我们表明,这种方法可用于通过校正色差来扩展 STED 显微镜的视场,否则这会导致聚焦激发和耗尽光束之间的走离。我们进一步展示了如何通过多光束激发和耗尽来适应这种布置以提高成像速度。仅使用 SLM 即可完成对准的微调,从而具有自动化的潜力。

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