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在大的正吉布斯(自由)能变化下通过电子转移实现高激发态CdSe/ZnS量子点中的闪烁抑制

Blinking Suppression in Highly Excited CdSe/ZnS Quantum Dots by Electron Transfer under Large Positive Gibbs (Free) Energy Change.

作者信息

Thomas Elizabeth Mariam, Ghimire Sushant, Kohara Reiko, Anil Ajith Nair, Yuyama Ken-Ichi, Takano Yuta, Thomas K George, Biju Vasudevanpillai

机构信息

Research Institute for Electronic Science , Hokkaido University , Sapporo , Hokkaido 001-0020 , Japan.

School of Chemistry , Indian Institute of Science Education and Research Thiruvananthapuram (IISER-TVM) , Thiruvananthapuram 695551 , India.

出版信息

ACS Nano. 2018 Sep 25;12(9):9060-9069. doi: 10.1021/acsnano.8b03010. Epub 2018 Aug 20.

Abstract

Semiconductor quantum dots with stable photoluminescence are necessary for next generation optoelectronic and photovoltaic devices. Photoluminescence intensity fluctuations of cadmium and lead chalcogenide quantum dots have been extensively investigated since the first observation of blinking in CdSe nanocrystals in 1996. In a quantum dot, blinking originates from stochastic photocharging, nonradiative Auger recombination, and delayed neutralization. So far, blinking is suppressed by defect passivation, electron transfer, and shell preparation, but without any deep insight into free energy change of electron transfer. We report real-time detection of significant blinking suppression for CdSe/ZnS quantum dots exposed to N, N-dimethylaniline, which is accompanied by a considerable increase in the time-averaged photoluminescence intensity of quantum dots. Although the Gibbs (free) energy change (Δ G = +2.24 eV), which is estimated electrochemically and from density functional theory calculations, is unfavorable for electron transfer from N, N-dimethylaniline to a quantum dot in the minimally excited (band-edge) state, electron transfer is obvious when a quantum dot is highly excited. Nonetheless, Δ G crosses from the positive to negative scale as the solvent dielectric constant exceeds 5, favoring electron transfer from N, N-dimethylaniline to a quantum dot excited to the band-edge state. Based on single-molecule photoluminescence and ensemble electron transfer studies, we assign blinking suppression to the transfer of an electron from N, N-dimethylaniline to the hot hole state of a quantum dot. In addition to blinking suppression by electron transfer, complete removal of blinking is limited by short-living OFF states induced by the negative trion.

摘要

具有稳定光致发光特性的半导体量子点是下一代光电器件和光伏器件所必需的。自1996年首次观察到CdSe纳米晶体中的闪烁现象以来,镉和铅硫族化物量子点的光致发光强度波动已得到广泛研究。在量子点中,闪烁源于随机光充电、非辐射俄歇复合和延迟中和。到目前为止,通过缺陷钝化、电子转移和壳层制备可以抑制闪烁,但对电子转移的自由能变化缺乏深入了解。我们报告了对暴露于N,N-二甲基苯胺的CdSe/ZnS量子点显著闪烁抑制的实时检测,这伴随着量子点时间平均光致发光强度的显著增加。尽管通过电化学和密度泛函理论计算估计的吉布斯(自由)能变化(ΔG = +2.24 eV)不利于电子从N,N-二甲基苯胺转移到最低激发(带边)态的量子点,但当量子点处于高激发态时,电子转移是明显的。然而,当溶剂介电常数超过5时,ΔG从正标度变为负标度,有利于电子从N,N-二甲基苯胺转移到激发到带边态的量子点。基于单分子光致发光和整体电子转移研究,我们将闪烁抑制归因于电子从N,N-二甲基苯胺转移到量子点的热空穴态。除了通过电子转移抑制闪烁外,由负三重态诱导的短寿命关断状态限制了闪烁的完全消除。

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