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眨眼过程中孔的作用的证据:负电荷和氧化的 CdSe/CdS 点。

Evidence for the role of holes in blinking: negative and oxidized CdSe/CdS dots.

机构信息

James Franck Institute, 929 E. 57th Street, The University of Chicago, Chicago, Illinois 60637, USA.

出版信息

ACS Nano. 2012 Oct 23;6(10):9125-32. doi: 10.1021/nn303396c. Epub 2012 Sep 26.

Abstract

Thin shell CdSe/CdS colloidal quantum dots with a small 3 nm core diameter exhibit typical blinking and a binary PL intensity distribution. Electrochemical charging with one electron suppresses the blinking. With a larger core of 5 nm, the blinking statistics of on and off states is identical to that of a smaller core but the dots also display a grey state with a finite duration time (~6 ms) on glass. However, the grey state disappears on the electron-accepting ZnO nanocrystals film. In addition, the grey state PL lifetime on glass is similar to the trion lifetime measured from electrochemically charged dots. Therefore, the grey state is assigned to the photocharged negative dots. It is concluded that a grey state is always present as the dots get negatively photocharged even though it might not be observed due to the brightness of the trion and/or the duration time of the negative charge. With thick shell CdSe/CdS dots under electrochemical control, multiple charging, up to four electrons per dot, is observed as sequential changes in the photoluminescence lifetime which can be described by the Nernst equation. The small potential increment confirms the weak electron confinement with the thick CdS shell. Finally, the mechanism of hole-trapping and surface oxidation by the hole is proposed to account for the grey state and off state in the blinking.

摘要

具有 3nm 小核直径的薄壳 CdSe/CdS 胶体量子点表现出典型的闪烁和二元 PL 强度分布。用一个电子进行电化学充电会抑制闪烁。对于 5nm 较大的核,开和关状态的闪烁统计与较小核的闪烁统计相同,但这些点在玻璃上也显示出具有有限持续时间(约 6ms)的灰色状态。然而,在电子接受的 ZnO 纳米晶膜上,灰色状态消失。此外,玻璃上灰色状态的 PL 寿命与从电化学充电点测量的三重态寿命相似。因此,灰色状态被分配给光生负点。可以得出结论,即使由于三重态的亮度和/或负电荷的持续时间而可能观察不到,但当点被负光生电荷时,总是存在灰色状态。在电化学控制下的厚壳 CdSe/CdS 点中,观察到多达每个点四个电子的多次充电,这可以通过能斯特方程来描述 PL 寿命的顺序变化。小的电位增量证实了厚 CdS 壳的弱电子限制。最后,提出了空穴的空穴捕获和表面氧化的机制,以解释闪烁中的灰色状态和关闭状态。

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