College of Communications Engineering, Chongqing University, Chongqing 400044, China.
School of Engineering, University of Guelph, Guelph, ON N1G 2W1, Canada.
Sensors (Basel). 2018 Sep 25;18(10):3222. doi: 10.3390/s18103222.
Near-infrared (NIR) spectral sensors deliver the spectral response of the light absorbed by materials for quantification, qualification or identification. Spectral analysis technology based on the NIR sensor has been a useful tool for complex information processing and high precision identification in the tobacco industry. In this paper, a novel method based on the support vector machine (SVM) is proposed to discriminate the tobacco cultivation region using the near-infrared (NIR) sensors, where the genetic algorithm (GA) is employed for input subset selection to identify the effective principal components (PCs) for the SVM model. With the same number of PCs as the inputs to the SVM model, a number of comparative experiments were conducted between the effective PCs selected by GA and the PCs orderly starting from the first one. The model performance was evaluated in terms of prediction accuracy and four parameters of assessment criteria (true positive rate, true negative rate, positive predictive value and F1 score). From the results, it is interesting to find that some PCs with less information may contribute more to the cultivation regions and are considered as more effective PCs, and the SVM model with the effective PCs selected by GA has a superior discrimination capacity. The proposed GA-SVM model can effectively learn the relationship between tobacco cultivation regions and tobacco NIR sensor data.
近红外(NIR)光谱传感器提供了材料吸收光的光谱响应,用于定量、定性或识别。基于 NIR 传感器的光谱分析技术已成为烟草工业中复杂信息处理和高精度识别的有用工具。在本文中,提出了一种基于支持向量机(SVM)的新方法,利用近红外(NIR)传感器来区分烟草种植区域,其中遗传算法(GA)用于输入子集选择,以确定 SVM 模型的有效主成分(PC)。使用与 SVM 模型输入相同数量的 PC,在 GA 选择的有效 PC 和从第一个 PC 开始的 PC 之间进行了多项比较实验。通过预测准确率和评估标准的四个参数(真阳性率、真阴性率、阳性预测值和 F1 分数)来评估模型性能。结果有趣地发现,一些信息量较少的 PC 可能对种植区域的贡献更大,被认为是更有效的 PC,并且使用 GA 选择的有效 PC 的 SVM 模型具有更好的区分能力。所提出的 GA-SVM 模型可以有效地学习烟草种植区域和烟草 NIR 传感器数据之间的关系。