Choi Young Hee, Hong Chae Kyu, Park Geon Yong, Kim Chang Kyu, Kim Jung Hun, Jung Kwon, Kwon Joong-Ho
Special Inspection Team, Seoul Metropolitan Government Research Institute of Public Health and Environment, Seoul, 13818 Korea.
1School of Food Science and Biotechnology, Kyungpook National University, Daegu, 41566 Korea.
Food Sci Biotechnol. 2016 Apr 30;25(2):433-438. doi: 10.1007/s10068-016-0059-x. eCollection 2016.
An energy dispersive X-ray fluorescence (ED-XRF) spectrometer and a near infrared (NIR) spectrometer combined with chemometrics were applied for origin discrimination of 48 Korean, 44 Chinese, and 21 Indian sesame seed samples used for development of a discriminant calibration model. Multi-elemental ED-XRF analysis based on Mg, Al, Si, P, S, Cl, K, Ca, Mn, Fe, and Cu was used for comparisons among origins. All elements, except for Fe, showed differences and 96.5% of seed samples were assigned to the correct origin using discriminant analysis based on chemical analytical results. NIR measurements were performed for spectral scanning. Classification of seeds using NIR discriminant analysis achieved 89.4% of seed samples assigned to the correct origin. Both ED-XRF and NIR are useful as nondestructive tools for discrimination of sesame seed origins.
采用能量色散X射线荧光光谱仪（ED-XRF）和近红外光谱仪（NIR）结合化学计量学方法，对48份韩国芝麻、44份中国芝麻和21份印度芝麻种子样本进行产地鉴别，以建立判别校准模型。基于镁、铝、硅、磷、硫、氯、钾、钙、锰、铁和铜的多元素ED-XRF分析用于不同产地之间的比较。除铁元素外，所有元素均表现出差异，基于化学分析结果的判别分析将96.5%的种子样本正确归类到其产地。进行近红外测量以进行光谱扫描。使用近红外判别分析对种子进行分类，89.4%的种子样本被正确归类到其产地。ED-XRF和NIR均作为鉴别芝麻种子产地的无损工具十分有用。
