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微正则系综 RT-TDDFT 模拟真实扩展器件。

Microcanonical RT-TDDFT simulations of realistically extended devices.

机构信息

Integrated Systems Laboratory, ETH Zürich, 8092 Zürich, Switzerland.

IMEC, 75 Kapeldreef, B-3001 Leuven, Belgium.

出版信息

J Chem Phys. 2018 Sep 28;149(12):124701. doi: 10.1063/1.5040048.

Abstract

In this paper, real-time time-dependent density functional theory (RT-TDDFT) calculations of realistically sized nanodevices are presented. These microcanonical simulations rely on a closed boundary approach based on recent advances in the software package CP2K. The obtained results are compared to those derived from the open-boundary Non-equilibrium Green's Function (NEGF) formalism. A good agreement between the "current vs. voltage" characteristics produced by both methods is demonstrated for three representative device structures, a carbon nanotube field-effect transistor, a GeSe selector for crossbar arrays, and a conductive bridging random-access memory cell. Different approaches to extract the electrostatic contribution from the RT-TDDFT Hamiltonian and to incorporate the result into the NEGF calculations are presented.

摘要

本文提出了一种实时时间依赖密度泛函理论(RT-TDDFT)计算真实尺寸纳米器件的方法。这些微正则模拟依赖于基于 CP2K 软件包的最新进展的封闭边界方法。将得到的结果与从非平衡格林函数(NEGF)形式主义的开放边界方法得出的结果进行了比较。对于三种具有代表性的器件结构,即碳纳米管场效应晶体管、用于交叉阵列的 GeSe 选择器和导电桥随机存取存储器单元,展示了这两种方法在“电流与电压”特性方面的良好一致性。本文还提出了从 RT-TDDFT 哈密顿量中提取静电贡献并将结果纳入 NEGF 计算的不同方法。

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