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在单层-双层 WSe 横向异质结构中进行能量分辨光导测绘。

Energy-Resolved Photoconductivity Mapping in a Monolayer-Bilayer WSe Lateral Heterostructure.

机构信息

Department of Physics, Center for Complex Quantum Systems , The University of Texas , Austin , Texas 78712 , United States.

Physical Sciences and Engineering Divison , King Abdullah University of Science and Technology , Thuwal 23955-6900 , Kingdom of Saudi Arabia.

出版信息

Nano Lett. 2018 Nov 14;18(11):7200-7206. doi: 10.1021/acs.nanolett.8b03318. Epub 2018 Oct 10.

DOI:10.1021/acs.nanolett.8b03318
PMID:30289264
Abstract

Vertical and lateral heterostructures of van der Waals materials provide tremendous flexibility for band-structure engineering. Because electronic bands are sensitively affected by defects, strain, and interlayer coupling, the edge and heterojunction of these two-dimensional (2D) systems may exhibit novel physical properties, which can be fully revealed only by spatially resolved probes. Here, we report the spatial mapping of photoconductivity in a monolayer-bilayer WSe lateral heterostructure under multiple excitation lasers. As the photon energy increases, the light-induced conductivity detected by microwave impedance microscopy first appears along the heterointerface and bilayer edge, then along the monolayer edge, inside the bilayer area, and finally in the interior of the monolayer region. The sequential emergence of mobile carriers in different sections of the sample is consistent with the theoretical calculation of local energy gaps. Quantitative analysis of the microscopy and transport data also reveals the linear dependence of photoconductivity on the laser intensity and the influence of interlayer coupling on carrier recombination. Combining theoretical modeling, atomic-scale imaging, mesoscale impedance microscopy, and device-level characterization, our work suggests an exciting perspective for controlling the intrinsic band gap variation in 2D heterostructures down to a regime of a few nanometers.

摘要

范德华材料的垂直和横向异质结构为能带结构工程提供了巨大的灵活性。由于电子能带对缺陷、应变和层间耦合非常敏感,这些二维(2D)系统的边缘和异质结可能表现出新颖的物理性质,只有通过空间分辨探针才能充分揭示这些性质。在这里,我们报告了在多层 WSe 横向异质结构中单层-双层的光致导率的空间映射,该结构在多个激发激光下工作。随着光子能量的增加,微波阻抗显微镜检测到的光致导电性首先出现在异质界面和双层边缘,然后出现在单层边缘、双层区域内部,最后出现在单层区域内部。样品不同部分中移动载流子的顺序出现与局部能隙的理论计算一致。显微镜和输运数据的定量分析还揭示了光致导率与激光强度的线性关系,以及层间耦合对载流子复合的影响。通过理论建模、原子尺度成像、介观阻抗显微镜和器件级特性表征,我们的工作为控制二维异质结构中的固有能带隙变化提供了一个令人兴奋的视角,其范围可缩小到几个纳米。

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