Jensen Daniel André, Høvik Marie Farstad, Monsen Nadja Josefine Nyhammer, Eggen Thale Hegdahl, Eichele Heike, Adolfsdottir Steinunn, Plessen Kerstin Jessica, Sørensen Lin
The Department of Biological and Medical Psychology, University of Bergen, Bergen, Norway.
K.G. Jebsen Centre for Research on Neuropsychiatric Disorders, Bergen, Norway.
Front Psychol. 2018 Oct 2;9:1846. doi: 10.3389/fpsyg.2018.01846. eCollection 2018.
Emotional lability (EL) often co-occurs with attention-deficit/hyperactivity disorder (ADHD) in children. However, difficulties of regulating intense emotions in ADHD are still poorly understood. We investigated the potential role of working memory (WM) as a protective factor against EL in children with ADHD by building on models describing the close relationship between WM and regulation of emotions. The parents of 41 children with ADHD and 34 typically developing children (TDC) filled out the emotional control scale (ECS) from the Behavior Rating Inventory of Executive Functioning and the child behavior checklist (CBCL). The children themselves completed the backward conditions of the digit span (DS) and spatial span (SS) tasks as well as the letter-umber sequencing (LNS) task. The results of a stepwise regression analysis confirmed the negative relationship between parent reported EL measured using the ECS and scores on the LNS, when controlling for symptoms of ADHD and oppositional defiant disorder (ODD). WM thus seems to be important for the ability of the children to express emotions in an adaptive and flexible way. We therefore suggest that a poorer WM capacity, which is often found in children with ADHD, may be a predictor of high levels of EL.
情绪不稳定(EL)在儿童中常与注意力缺陷多动障碍(ADHD)同时出现。然而,ADHD患儿调节强烈情绪的困难仍未得到充分理解。我们通过构建描述工作记忆(WM)与情绪调节之间密切关系的模型,研究了WM作为ADHD患儿EL保护因素的潜在作用。41名ADHD患儿和34名发育正常儿童(TDC)的家长填写了执行功能行为评定量表中的情绪控制量表(ECS)和儿童行为检查表(CBCL)。孩子们自己完成了数字广度(DS)和空间广度(SS)任务的倒序条件以及字母-数字排序(LNS)任务。逐步回归分析结果证实,在控制ADHD和对立违抗障碍(ODD)症状时,使用ECS测量的家长报告的EL与LNS得分之间呈负相关。因此,WM似乎对儿童以适应性和灵活性方式表达情绪的能力很重要。我们因此认为,ADHD患儿中常见的较差WM能力可能是高EL水平的一个预测指标。