Tabata Hiroshi, Sato Yuta, Oi Kouhei, Kubo Osamu, Katayama Mitsuhiro
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering , Osaka University , 2-1 Yamadaoka , Suita , Osaka 565-0871 , Japan.
ACS Appl Mater Interfaces. 2018 Nov 7;10(44):38387-38393. doi: 10.1021/acsami.8b14667. Epub 2018 Oct 29.
We report on the gas-sensing characteristics of a van der Waals heterojunction consisting of graphene and a MoS flake. To extract the response actually originating from the heterojunction area, the other gas-sensitive parts were passivated by gas barrier layers. The graphene/MoS heterojunction device demonstrated a significant change in resistance, by a factor of greater than 10, upon exposure to 1 ppm NO under a reverse-bias condition, which was revealed to be a direct reflection of the modulation of the Schottky barrier height at the graphene/MoS interface. The magnitude of the response demonstrated strong dependences on the bias and back-gate voltages. The response further increased with increasing reverse bias. Conversely, it dramatically decreased when measured at a large forward bias or a large positive back-gate voltage. These behaviors were analyzed using a metal-semiconductor-metal diode model consisting of graphene/MoS and counter Ti/MoS Schottky diodes.
我们报道了由石墨烯和二硫化钼薄片组成的范德华异质结的气敏特性。为了提取实际源自异质结区域的响应,其他气敏部分用气障层进行了钝化处理。石墨烯/二硫化钼异质结器件在反向偏置条件下暴露于1 ppm一氧化氮时,电阻发生了显著变化,变化因子大于10,这被证明是石墨烯/二硫化钼界面处肖特基势垒高度调制的直接反映。响应幅度对偏置电压和背栅电压有很强的依赖性。随着反向偏置的增加,响应进一步增强。相反,在大的正向偏置或大的正背栅电压下测量时,响应急剧下降。使用由石墨烯/二硫化钼和反向钛/二硫化钼肖特基二极管组成的金属-半导体-金属二极管模型对这些行为进行了分析。