Shourav Mohiuddin Khan, Kim Kyunghoon, Kim Subin, Kim Jung Kyung
Department of Mechanical Engineering, Graduate School, Kookmin University, 77 Jeongneung-ro, Seongbuk-gu, Seoul 02707, Korea.
School of Mechanical Systems Engineering, Kookmin University, 77 Jeongneung-ro, Seongbuk-gu, Seoul 02707, Korea.
Micromachines (Basel). 2016 Jul 20;7(7):125. doi: 10.3390/mi7070125.
Field curvature and other aberrations are encountered inevitably when designing a compact fluorescence imaging system with a simple lens. Although multiple lens elements can be used to correct most such aberrations, doing so increases system cost and complexity. Herein, we propose a wide field-of-view (FOV) fluorescence imaging method with an unconventional optical-quality curved sample chamber that corrects the field curvature caused by a simple lens. Our optics simulations and proof-of-concept experiments demonstrate that a curved substrate with lens-dependent curvature can reduce greatly the distortion in an image taken with a conventional planar detector. Following the validation study, we designed a curved sample chamber that can contain a known amount of sample volume and fabricated it at reasonable cost using plastic injection molding. At a magnification factor of approximately 0.6, the curved chamber provides a clear view of approximately 119 mm², which is approximately two times larger than the aberration-free area of a planar chamber. Remarkably, a fluorescence image of microbeads in the curved chamber exhibits almost uniform intensity over the entire field even with a simple lens imaging system, whereas the distorted boundary region has much lower brightness than the central area in the planar chamber. The absolute count of white blood cells stained with a fluorescence dye was in good agreement with that obtained by a commercially available conventional microscopy system. Hence, a wide FOV imaging system with the proposed curved sample chamber would enable us to acquire an undistorted image of a large sample volume without requiring a time-consuming scanning process in point-of-care diagnostic applications.
在设计一个采用简单透镜的紧凑型荧光成像系统时,不可避免地会遇到场曲和其他像差。虽然可以使用多个透镜元件来校正大多数此类像差,但这样做会增加系统成本和复杂性。在此,我们提出一种具有非常规光学质量的弯曲样品腔的宽视场(FOV)荧光成像方法,该方法可校正由简单透镜引起的场曲。我们的光学模拟和概念验证实验表明,具有与透镜相关曲率的弯曲基板可以大大减少使用传统平面探测器拍摄图像时的失真。在验证研究之后,我们设计了一个可以容纳已知量样品体积的弯曲样品腔,并使用注塑成型以合理的成本制造了它。在放大倍数约为0.6时,弯曲腔提供了约119 mm²的清晰视野,这大约是平面腔无像差区域的两倍。值得注意的是,即使使用简单透镜成像系统,弯曲腔中微珠的荧光图像在整个视场中也显示出几乎均匀的强度,而在平面腔中,失真的边界区域的亮度远低于中心区域。用荧光染料染色的白细胞的绝对计数与通过市售传统显微镜系统获得的计数非常一致。因此,具有所提出的弯曲样品腔的宽视场成像系统将使我们能够在即时诊断应用中获取大样品体积的无失真图像,而无需耗时的扫描过程。