Chen Zhenhua, Yao Yue, Zhu Yuanhuan, Ma Hui
Opt Express. 2018 Oct 29;26(22):28288-28301. doi: 10.1364/OE.26.028288.
In this paper we report a method for removing artifacts caused by the beam splitter in a collinear backscattering Mueller matrix (CBMM) imaging system. As an essential optical component in a collinear back reflection optical path, a 45ϵ,ρ,δ beam splitter has to be used to separate the incident and the reflection beam. Since the beam splitter induces parasitic dichroism and retardance artifacts in both the illumination and detection optical paths, it leads to artifacts in the experimental results of Muller matrix measurements. We examined the influence of the beam splitter to the measured Mueller matrices in detail and reduced those artifacts in the CBMM system by precisely reconstructing the instrument matrix with a numerical calculation method. By measuring three standard samples we can calculate multiple systematic errors and the polarization characteristics of beam splitter in the CBMM system simultaneously. After the calibration, the maximum error in the Mueller matrix elements can be reduced to less than 0.02.
在本文中,我们报告了一种在共线背向散射穆勒矩阵(CBMM)成像系统中去除由分束器引起的伪影的方法。作为共线背向反射光路中的一个重要光学元件,必须使用一个45ϵ,ρ,δ分束器来分离入射光束和反射光束。由于分束器在照明光路和检测光路中都会引起寄生二向色性和延迟伪影,这会导致穆勒矩阵测量的实验结果出现伪影。我们详细研究了分束器对测量的穆勒矩阵的影响,并通过使用数值计算方法精确重建仪器矩阵,在CBMM系统中减少了这些伪影。通过测量三个标准样品,我们可以同时计算出CBMM系统中的多个系统误差和分束器的偏振特性。校准后,穆勒矩阵元素的最大误差可降低到小于0.02。