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大体积电子显微镜与神经微回路分析。

Large Volume Electron Microscopy and Neural Microcircuit Analysis.

机构信息

Division of Cerebral Circuitry, National Institute for Physiological Sciences (NIPS), Okazaki, Japan.

Department of Physiological Sciences, The Graduate University for Advanced Studies (SOKENDAI), Okazaki, Japan.

出版信息

Front Neural Circuits. 2018 Nov 12;12:98. doi: 10.3389/fncir.2018.00098. eCollection 2018.

Abstract

One recent technical innovation in neuroscience is microcircuit analysis using three-dimensional reconstructions of neural elements with a large volume Electron microscopy (EM) data set. Large-scale data sets are acquired with newly-developed electron microscope systems such as automated tape-collecting ultramicrotomy (ATUM) with scanning EM (SEM), serial block-face EM (SBEM) and focused ion beam-SEM (FIB-SEM). Currently, projects are also underway to develop computer applications for the registration and segmentation of the serially-captured electron micrographs that are suitable for analyzing large volume EM data sets thoroughly and efficiently. The analysis of large volume data sets can bring innovative research results. These recently available techniques promote our understanding of the functional architecture of the brain.

摘要

神经科学领域的一项最新技术创新是利用具有大容量电子显微镜(EM)数据集的神经元件的三维重建进行微电路分析。通过新开发的电子显微镜系统(如带有扫描 EM(SEM)的自动带收集超薄切片机(ATUM)、连续块面 EM(SBEM)和聚焦离子束-SEM(FIB-SEM))可以获取大规模数据集。目前,还在开发计算机应用程序,用于注册和分割连续捕获的电子显微镜照片,以便彻底高效地分析大容量 EM 数据集。分析大容量数据集可以带来创新性的研究成果。这些最新可用的技术促进了我们对大脑功能架构的理解。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/4070/6240581/d56288bd02b7/fncir-12-00098-g0001.jpg

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