van der Stam Ward, du Fossé Indy, Grimaldi Gianluca, Monchen Julius O V, Kirkwood Nicholas, Houtepen Arjan J
Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, van der Maasweg 9, 2629 HZ Delft, The Netherlands.
Chem Mater. 2018 Nov 13;30(21):8052-8061. doi: 10.1021/acs.chemmater.8b03893. Epub 2018 Oct 23.
The photoluminescence (PL) quantum yield of semiconductor nanocrystals (NCs) is hampered by in-gap trap states due to dangling orbitals on the surface of the nanocrystals. While crucial for the rational design of nanocrystals, the understanding of the exact origin of trap states remains limited. Here, we treat CdTe nanocrystal films with different metal chloride salts and we study the effect on their optical properties with spectroelectrochemistry, recording both changes in absorption and photoluminescence. For untreated CdTe NC films we observe a strong increase in the PL intensity as the Fermi-level is raised electrochemically and trap states in the bandgap become occupied with electrons. Upon passivation of these in-gap states we observe an increase in the steady state PL and, for the best treatments, we observe that the PL no longer depends on the position of the Fermi level in the band gap, demonstrating the effective removal of trap states. The most effective treatment is obtained for Z-type passivation with CdCl, for which the steady state PL increased by a factor 40 and the PL intensity became nearly unaffected by the applied potential. X-ray Photoelectron Spectroscopy measurements show that treatment with ZnCl mainly leads to X-type passivation with chloride ions, which increased the PL intensity by a factor four and made the PL less susceptible to modulation by applying a potential with respect to unpassivated nanocrystal films. We elucidate the spectroelectrochemical signatures of trap states within the bandgap and conclude that undercoordinated Te at the surface constitutes the largest contribution to in-gap trap states, but that other surface states that likely originate on Cd atoms should also be considered.
半导体纳米晶体(NCs)的光致发光(PL)量子产率受到纳米晶体表面悬空轨道导致的带隙陷阱态的阻碍。虽然对于纳米晶体的合理设计至关重要,但对陷阱态的确切起源的理解仍然有限。在这里,我们用不同的金属氯化物盐处理CdTe纳米晶体薄膜,并通过光谱电化学研究其对光学性质的影响,记录吸收和光致发光的变化。对于未处理的CdTe NC薄膜,我们观察到随着费米能级电化学升高且带隙中的陷阱态被电子占据,PL强度显著增加。在这些带隙态被钝化后,我们观察到稳态PL增加,并且对于最佳处理情况,我们观察到PL不再依赖于带隙中费米能级的位置,这表明陷阱态被有效去除。用CdCl进行Z型钝化得到的处理效果最有效,其稳态PL增加了40倍,并且PL强度几乎不受施加电势的影响。X射线光电子能谱测量表明,用ZnCl处理主要导致氯离子的X型钝化,这使PL强度增加了四倍,并且相对于未钝化的纳米晶体薄膜,PL受施加电势调制的影响较小。我们阐明了带隙内陷阱态的光谱电化学特征,并得出结论,表面配位不足的Te对带隙陷阱态的贡献最大,但也应考虑可能源自Cd原子的其他表面态。