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利用K到K的X射线强度比测定Ni-B合金涂层中Ni的价电子结构

Determination of valence electronic structure of Ni in Ni-B alloy coatings using K-to-K X-ray intensity ratios.

作者信息

Cengiz Erhan, Köksal Oğuz Kağan, Apaydın Gökhan, Karahan İsmail Hakkı, Ünal Ersin

机构信息

Alanya Alaaddin Keykubat University, Faculty of Engineering, Department of Fundamental Sciences, Antalya, Turkey.

Karadeniz Technical University, Faculty of Science, Department of Physics, Trabzon, Turkey.

出版信息

Appl Radiat Isot. 2019 Feb;144:24-28. doi: 10.1016/j.apradiso.2018.11.009. Epub 2018 Nov 23.

Abstract

In this study, K-to-K X-ray intensity ratios of Ni in Ni-B alloy coatings were investigated. These samples were excited by 59.5 keV gamma-rays from a Am annular radioactive source. K X-rays emitted by the samples were counted using an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The K-to-K X-ray intensity ratios of Ni-B alloys are compared with pure Ni and each other. Deviations between the results were explained by the change in valence electronic structures of Ni in Ni-B alloy coatings.

摘要

在本研究中,对镍硼合金涂层中镍的K对K X射线强度比进行了研究。这些样品由来自镅环形放射源的59.5 keV伽马射线激发。使用在5.9 keV下分辨率为150 eV的超低温锗探测器对样品发射的K X射线进行计数。将镍硼合金的K对K X射线强度比与纯镍以及彼此进行比较。结果之间的偏差通过镍硼合金涂层中镍的价电子结构变化来解释。

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