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CdS/CuZn(SnGe )Se 异质界面能带排列及 CuZn(SnGe )Se 表面电子性质:x = 0、0.2 和 0.4。

Band Alignment of the CdS/CuZn(SnGe )Se Heterointerface and Electronic Properties at the CuZn(SnGe )Se Surface: x = 0, 0.2, and 0.4.

机构信息

Research Center for Photovoltaics (RCPV) , National Institute of Advanced Industrial Science and Technology (AIST) , Central 2, 1-1-1 Umezono , Tsukuba , Ibaraki 305-8568 , Japan.

Graduate School of Science and Engineering , Kagoshima University , 1-21-40 Korimoto , Kagoshima 890-0065 , Japan.

出版信息

ACS Appl Mater Interfaces. 2019 Jan 30;11(4):4637-4648. doi: 10.1021/acsami.8b19200. Epub 2019 Jan 18.

Abstract

The surface electronic properties of the light absorber and band alignment at the p/n heterointerface are key issues for high-performance heterojunction solar cells. We investigated the band alignment of the heterointerface between cadmium sulfide (CdS) and Ge-incorporated CuZnSnSe (CZTGSe), with Ge/(Ge + Sn) ratios ( x) between 0 and 0.4, by X-ray photoelectron, ultraviolet, and inversed photoemission spectroscopies (XPS, UPS, and IPES, respectively). In particular, we used interface-induced band bending in order to determine the conduction band offset (CBO) and valence-band offset (VBO), which were calculated from the core-level shifts of each element in both the CdS overlayer and the CZTGSe bottom layer. Moreover, the surface electronic properties of CZTGSe were also investigated by laser-irradiated XPS. The CBO at the CdS/CZTGSe heterointerface decreased linearly, from +0.36 to +0.20 eV, as x was increased from 0 to 0.4; in contrast, the VBO at the CdS/CZTGSe heterointerface was independent of Ge content. Both UPS and IPES revealed that the Fermi level at the CZTGSe surface is located near the center of the band gap. The hole concentration at the CZTGSe surface was on the order of 10 cm, which is much smaller than that of the bulk (∼10 cm). We discuss the differences in hole deficiencies near the surface and in the bulk on the basis of laser-irradiated XPS and conclude that hole deficiencies are due to defects distributed near the surface with densities that are lower than in the bulk, and the Fermi level is not pinned at the CZTGSe surface.

摘要

光吸收剂的表面电子特性和 p/n 异质界面处的能带排列是高性能异质结太阳能电池的关键问题。我们通过 X 射线光电子能谱、紫外光电子能谱和反型光发射谱(XPS、UPS 和 IPES)研究了 CdS 与掺 Ge 的 CuZnSnSe(CZTGSe)之间异质界面的能带排列,其中 Ge/(Ge+Sn) 比(x)在 0 到 0.4 之间。特别是,我们利用界面诱导能带弯曲来确定导带偏移(CBO)和价带偏移(VBO),这是通过 CdS 覆盖层和 CZTGSe 底层中每个元素的芯层位移计算得出的。此外,我们还通过激光辐照 XPS 研究了 CZTGSe 的表面电子特性。随着 x 从 0 增加到 0.4,CdS/CZTGSe 异质界面的 CBO 线性减小,从+0.36 到+0.20 eV;相比之下,CdS/CZTGSe 异质界面的 VBO 与 Ge 含量无关。UPS 和 IPES 都表明,CZTGSe 表面的费米能级位于带隙中心附近。CZTGSe 表面的空穴浓度约为 10 cm,远小于体相(约 10 cm)。我们根据激光辐照 XPS 讨论了表面附近和体相中空穴缺陷的差异,并得出结论,空穴缺陷是由于分布在表面附近的缺陷密度低于体相,且费米能级未在 CZTGSe 表面固定。

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