5-30 keV能量范围内初级束流能量对液体二次离子化质谱中二次离子溅射效率的影响。 - Suppr | 超能文献

Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.

作者信息

Aberth W H, Burlingame A L

出版信息

Anal Chem. 1988 Jul 15;60(14):1426-8. doi: 10.1021/ac00165a016.

DOI:10.1021/ac00165a016

Abstract

摘要

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