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未对准微型透镜的高分辨率全场波前测量。

High resolution full field wavefront measurement of a misaligned miniature lens.

作者信息

Chang Hung-Sheng, Liang Chao-Wen

出版信息

Opt Express. 2018 Nov 26;26(24):31209-31221. doi: 10.1364/OE.26.031209.

DOI:10.1364/OE.26.031209
PMID:30650710
Abstract

Compared with the industry standard MTF consequential testing result, the full field transmitted wavefront testing is more analytical for field aberration analysis. A novel wavefront measuring device specialized for the miniature lens testing application is developed to measure the full field aberration in a high resolution of 35x36 radial-azimuthal fields. The device adapts the high dynamic range Shack-Hartman wavefront sensor to minimize the alignment uncertainty induced from collimator under high field angle. The plane symmetrical aberration due to elements misalignment is identified and quantified throughout the measured field. The field constant coma and field linear astigmatism contributes most aberration errors to the edge of the field as expected. Through the field dependent aberration analysis. This device proves that the miniature lens image quality near the edge of the field is practically limited by the misalignment of the optical elements.

摘要

与行业标准的MTF后续测试结果相比,全场透射波前测试在像场像差分析方面更具解析性。开发了一种专门用于微型透镜测试应用的新型波前测量装置,以在35x36径向-方位角场的高分辨率下测量全场像差。该装置采用高动态范围的夏克-哈特曼波前传感器,以最小化高视场角下准直仪引起的对准不确定性。在整个测量视场中识别并量化了由于元件未对准导致的平面对称像差。正如预期的那样,场常数彗差和场线性像散在视场边缘造成了大部分像差误差。通过视场相关像差分析,该装置证明了视场边缘附近的微型透镜图像质量实际上受光学元件未对准的限制。

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