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经导管使用Amplatzer房间隔封堵器闭合房间隔缺损后血清镍和钛水平

Serum Nickel and Titanium Levels after Transcatheter Closure of Atrial Septal Defects with Amplatzer Septal Occluder.

作者信息

Elkiran Ozlem, Karakurt Cemsit, Kocak Gulendam, Taskapan Cagatay

机构信息

Department of Pediatric Cardiology, Faculty of Medicine, Inonu University, Malatya, Turkey.

Department of Pediatric Cardiology, Medical Park Hospital, Istanbul, Turkey.

出版信息

Cardiol Res Pract. 2019 Jan 2;2019:7891746. doi: 10.1155/2019/7891746. eCollection 2019.

DOI:10.1155/2019/7891746
PMID:30719342
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC6334312/
Abstract

INTRODUCTION

There is a concern about release of nickel and titanium after implantation of nitinol-containing devices.

OBJECTIVE

To evaluate serum nickel and titanium release after implantation of Amplatzer occluder.

MATERIALS AND METHODS

In 38 pediatric patients with no history of nickel sensitivity, blood samples were drawn 24 hours before and 24 hours, 1, 3, 6, and 12 months after implantation. Nickel and titanium concentrations were measured by atomic absorption spectrophotometry.

RESULTS

The median serum nickel level which was 0.44 ng/mL before the implantation increased to 1.01 ng/mL 24 hours after implantation and 1.72 ng/mL one month after implantation. The maximum level was detected 3 months after implantation, with a median level of 1.96 ng/mL. During follow-up, the nickel levels decreased to those measured before implantation. Serum nickel levels at the 24th hour, 1st month, and 3rd month following implantation were found to have increased significantly. No patients showed a detectable serum titanium level.

DISCUSSION

This is the first study that evaluated both serum nickel and titanium release after implantation of the Amplatzer occluder. Our study shows that nickel is released from the device in the first few months after implantation. Therefore, in patients with nickel allergy, other devices may be considered.

摘要

引言

含镍钛合金的装置植入后,人们担心镍和钛的释放问题。

目的

评估植入Amplatzer封堵器后血清中镍和钛的释放情况。

材料与方法

选取38例无镍过敏史的儿科患者,在植入前24小时以及植入后24小时、1个月、3个月、6个月和12个月采集血样。采用原子吸收分光光度法测定镍和钛的浓度。

结果

植入前血清镍水平中位数为0.44 ng/mL,植入后24小时升至1.01 ng/mL,植入后1个月为1.72 ng/mL。植入后3个月检测到最高水平,中位数为1.96 ng/mL。在随访期间,镍水平降至植入前测得的水平。发现植入后第24小时、第1个月和第3个月的血清镍水平显著升高。没有患者血清钛水平可检测到。

讨论

这是第一项评估植入Amplatzer封堵器后血清镍和钛释放情况的研究。我们的研究表明,镍在植入后的最初几个月从装置中释放出来。因此,对于镍过敏患者,可考虑使用其他装置。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3a73/6334312/955999d304c4/CRP2019-7891746.001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3a73/6334312/955999d304c4/CRP2019-7891746.001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3a73/6334312/955999d304c4/CRP2019-7891746.001.jpg

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