Herrera-Foessel S A, Singh R P, Huerta-Espino J, William H M, Djurle A, Yuen J
Department of Forest Mycology and Pathology, Swedish University of Agricultural Sciences (SLU), Box 7026, S 750 07 Uppsala, Sweden.
International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, 06600 Mexico, D.F., Mexico.
Plant Dis. 2008 Dec;92(12):1650-1654. doi: 10.1094/PDIS-92-12-1650.
Leaf rust, caused by Puccinia triticina, is an important disease of durum wheat (Triticum turgidum subsp. durum) worldwide, and the most effective way to control it is through the use of resistant cultivars. A partially dominant leaf rust resistance gene present in the International Maize and Wheat Improvement Center-derived Chilean cv. Guayacan INIA and its sister line Guayacan 2 was mapped to chromosome arm 6BS by identifying linked amplified fragment length polymorphisms (AFLPs) and mapping two of the molecular markers in common wheat (T. aestivum) linkage maps of the International Triticeae Mapping Initiative and Oligoculm × Fukuho-komugi populations. Comparison of infection type responses of the two resistant durums with common wheat testers carrying the previously mapped resistance genes Lr36 and Lr53 on 6BS, and their chromosomal positions, indicated that the resistance gene in durum wheat Guayacan INIA is a new leaf rust resistance gene, which was designated as Lr61. Gene Lr61 is effective against the P. triticina race BBG/BN predominant in northwestern Mexico and other races infecting durum wheat in various countries.
由小麦叶锈菌（Puccinia triticina）引起的叶锈病是全球硬粒小麦（Triticum turgidum subsp. durum）的一种重要病害，而控制该病最有效的方法是使用抗病品种。国际玉米和小麦改良中心培育的智利品种Guayacan INIA及其姊妹系Guayacan 2中存在的一个部分显性叶锈病抗性基因，通过鉴定连锁扩增片段长度多态性（AFLP）以及在国际小麦族作图倡议组织和Oligoculm×Fukuho-komugi群体的普通小麦（T. aestivum）连锁图谱中定位两个分子标记，被定位到6BS染色体臂上。将这两个抗病硬粒小麦与携带先前定位在6BS上的抗性基因Lr36和Lr53的普通小麦测试品种的侵染型反应及其染色体位置进行比较，表明硬粒小麦Guayacan INIA中的抗性基因是一个新的叶锈病抗性基因，被命名为Lr61。Lr61基因对墨西哥西北部占主导地位的小麦叶锈菌小种BBG/BN以及在各国侵染硬粒小麦的其他小种均有效。
