Kodjikian Stéphanie, Klein Holger
Université Grenoble Alpes and CNRS, Institut Néel, 38000 Grenoble, France.
Université Grenoble Alpes and CNRS, Institut Néel, 38000 Grenoble, France.
Ultramicroscopy. 2019 May;200:12-19. doi: 10.1016/j.ultramic.2019.02.010. Epub 2019 Feb 13.
A new electron diffraction tomography method is presented that is aimed to enable high performance electron crystallography experiments on beam sensitive materials using a standard TEM without any special equipment. Low-dose electron diffraction tomography minimizes the electron dose necessary for obtaining data sets suitable for structure solution by irradiating the crystal exclusively during the acquisition of the diffraction patterns. The performance of the method is successfully tested on two model structures, a complex oxide SrCuGeO and the beam sensitive metal-organic framework (MOF) of manganese formiate. Even when the limited lifetime of a beam sensitive material only allows obtaining a data set of rather low completeness, the data quality is high enough for the structures to be solved to a high precision. Low-dose electron diffraction tomography is easy to implement and doesn't require any special equipment or lengthy calibration processes, making it accessible to a large number of scientists.
本文提出了一种新的电子衍射断层扫描方法，旨在使用标准透射电子显微镜（TEM）对束敏感材料进行高性能电子晶体学实验，而无需任何特殊设备。低剂量电子衍射断层扫描通过仅在衍射图案采集期间照射晶体，将获得适用于结构解析的数据集所需的电子剂量降至最低。该方法的性能已在两种模型结构上成功测试，一种是复合氧化物SrCuGeO，另一种是对束敏感的甲酸锰金属有机框架（MOF）。即使束敏感材料的有限寿命仅允许获得完整性相当低的数据集，数据质量也足够高，足以高精度解析结构。低剂量电子衍射断层扫描易于实施，不需要任何特殊设备或冗长的校准过程，使大量科学家都能使用。
