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用于高分辨率单粒子追踪的光场超表面

A Light-Field Metasurface for High-Resolution Single-Particle Tracking.

作者信息

Holsteen Aaron L, Lin Dianmin, Kauvar Isaac, Wetzstein Gordon, Brongersma Mark L

机构信息

Geballe Laboratory for Advanced Materials , Stanford University , Stanford , California 94305-4045 , United States.

Department of Electrical Engineering , Stanford University , Stanford , California 94305 , United States.

出版信息

Nano Lett. 2019 Apr 10;19(4):2267-2271. doi: 10.1021/acs.nanolett.8b04673. Epub 2019 Mar 26.

Abstract

Three-dimensional (3D) single-particle tracking (SPT) is a key tool for studying dynamic processes in the life sciences. However, conventional optical elements utilizing light fields impose an inherent trade-off between lateral and axial resolution, preventing SPT with high spatiotemporal resolution across an extended volume. We overcome the typical loss in spatial resolution that accompanies light-field-based approaches to obtain 3D information by placing a standard microscope coverslip patterned with a multifunctional, light-field metasurface on a specimen. This approach enables an otherwise unmodified microscope to gather 3D information at an enhanced spatial resolution. We demonstrate simultaneous tracking of multiple fluorescent particles within a large 0.5 × 0.5 × 0.3 mm volume using a standard epi-fluorescent microscope with submicron lateral and micron-level axial resolution.

摘要

三维(3D)单粒子追踪(SPT)是研究生命科学中动态过程的关键工具。然而,利用光场的传统光学元件在横向和轴向分辨率之间存在固有的权衡,这阻碍了在扩展体积内以高时空分辨率进行SPT。我们通过在样本上放置一个带有多功能光场超表面图案的标准显微镜盖玻片,克服了基于光场方法获取三维信息时典型的空间分辨率损失。这种方法使未经修改的显微镜能够以更高的空间分辨率收集三维信息。我们使用具有亚微米横向分辨率和微米级轴向分辨率的标准落射荧光显微镜,展示了在一个大的0.5×0.5×0.3毫米体积内对多个荧光粒子的同时追踪。

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