通过X射线双折射成像对液晶材料中的相变进行空间分辨映射。
Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging.
作者信息
Zhou Yating, Patterson Rhian, Palmer Benjamin A, Edwards-Gau Gregory R, Kariuki Benson M, Kumar N S Saleesh, Bruce Duncan W, Dolbnya Igor P, Collins Stephen P, Malandain Andrew, Harris Kenneth D M
机构信息
School of Chemistry , Cardiff University , Park Place , Cardiff CF10 3AT , Wales , UK . Email:
Diamond Light Source , Harwell Science and Innovation Campus , Didcot , Oxfordshire OX11 0DE , England , UK.
出版信息
Chem Sci. 2019 Jan 2;10(10):3005-3011. doi: 10.1039/c8sc05285a. eCollection 2019 Mar 14.
The X-ray Birefringence Imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. We report the first application of the XBI technique to characterize molecular orientational ordering in a liquid crystalline material, demonstrating significant potential for exploiting XBI measurements to advance structural understanding of liquid crystal phases.
X射线双折射成像（XBI）技术于2014年首次报道，是一种用于空间分辨绘制各向异性材料局部取向特性的灵敏方法。我们报道了XBI技术首次应用于表征液晶材料中的分子取向有序性，证明了利用XBI测量推进对液晶相结构理解的巨大潜力。
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